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Showing 1 to 20 of 41 for “"depth profiling"”.

  1. Depth Profiling in Thin Films via Waveguide Spectroscopy

    A novel optical depth profiling technique is developed to depth profile thin optically transparent films which can be fabricated in the form of an asymmetric slab optical waveguide. Various methods for depth profiling thin dielectric films are also reviewed in a manner which illustrates the utility …

    uiuc Repository record for Depth Profiling in Thin Films via Waveguide Spectroscopy (opens in a new tab)

  2. Photoluminescence and depth profiling studies in gallium arsenide phosphide

    Submitted by Carolyn Mead (cmead2@illinois.edu) on 2011-06-17T16:08:46Z No. of bitstreams: 1 1980_yu.pdf: 4746427 bytes, checksum: 304b1d86cf5353e9342c44565e1ced55 (MD5)

    uiuc Repository record for Photoluminescence and depth profiling studies in gallium arsenide phosphide (opens in a new tab)

  3. Long-range depth profiling based on time-correlated single-photon counting

    … for the range resolution and surface profiling of distant target objects. Modern single-photon detectors offer high quantum efficiencies and small timing jitters in the order of tens of ps, allowing for the rapid acquisition of high-resolution time-of-flight information with eye-safe …

    heriot-watt Repository record for Long-range depth profiling based on time-correlated single-photon counting (opens in a new tab)

  4. Chemical effects in cluster SIMS depth profiling of polymer-based materials

    … the role played by chemistry in the in-depth analysis of polymer-based materials, the importance of which has become relevant with the introduction, in secondary ion mass spectrometry, of cluster ion sources. While the introduction of cluster-SIMS represented a real breakthrough in the …

    catania Repository record for Chemical effects in cluster SIMS depth profiling of polymer-based materials (opens in a new tab)

  5. Numerical modeling study of a neutron depth profiling (NDP) system for the Missouri S&T reactor

    <p>”For decades, Neutron Depth Profiling has been used for the non-destructive analysis and quantification of boron in electronic materials and lithium in lithium ion batteries. NDP is one of the few non-destructive analytical techniques capable of measuring the depth profiles of light elements to …

    must-thes Repository record for Numerical modeling study of a neutron depth profiling (NDP) system for the Missouri S&T reactor (opens in a new tab)

  6. Provenance and Tectonic Implications of LA-ICP-MS Zircon Depth-Profiling, Nanaimo Basin, British Columbia, Canada

    … petrographic observations with detrital zircon depth-profiling of thin zircon rims observed on >30% of zircons from Maastrichtian Nanaimo Group rocks. These data allow us to interpret tectono-metamorphic events that led to rim development in the sediment source region of the Nanaimo Basin, and …

    calgary Repository record for Provenance and Tectonic Implications of LA-ICP-MS Zircon Depth-Profiling, Nanaimo Basin, British Columbia, Canada (opens in a new tab)

  7. Gamma ray production cross sections of proton bombardment of fluorine for light element analysis and depth profiling

    Due to the interdependence of fusion reactor performance and the surface conditions of the plasma facing components (PFC), diagnostic techniques that monitor the conditions of PFCs are useful. One ion beam analysis (IBA) diagnostic technique utilizes particle induced gamma emission (PIGE) analysis …

    mit Repository record for Gamma ray production cross sections of proton bombardment of fluorine for light element analysis and depth profiling (opens in a new tab)

  8. An electrochemical and surface analytical investigation of iron oxidation, passivation and corrosion inhibition

    … mass spectrometry (TDMS) and ion bombardment (depth profiling) was used to investigate iron oxide films formed on iron by gas phase oxygen exposure as well as electrochemical polarization in borate buffer and corrosion inhibitor solutions.

    uiuc Repository record for An electrochemical and surface analytical investigation of iron oxidation, passivation and corrosion inhibition (opens in a new tab)

  9. Approaching the Complexity of Biological Specimen: New Mass Spectrometry Concepts in Ambient Ionization and Proteomics

    … sharpened-LMJ-SSP, allowing for subsurface and depth profiling of limes. Lime layer characterization is performed using data-dependent acquisition, identifying important compounds such as malic acid, citric acid, and quinic acid. Depth profiling is performed by constructing an automated syringe …

    queens Repository record for Approaching the Complexity of Biological Specimen: New Mass Spectrometry Concepts in Ambient Ionization and Proteomics (opens in a new tab)

  10. Surface layer evolution in glow discharge optical emission spectroscopy.

    … chemical composition of bulk materials and the depth profiling of multi-layer structures. Most research in the use of GDOES has concentrated on developing accurate methodologies for quantitative analysis and depth profiling. However, this thesis presents a study on various aspects of surface …

    sheffield-hallam Repository record for Surface layer evolution in glow discharge optical emission spectroscopy. (opens in a new tab)

  11. Laser induced emission spectrometry for rapid elemental analysis.

    … survey analysis of polymeric materials and the depth profiling of coated steels. A survey analysis of polymeric materials for twelve elements (Al, Ba, Ca, Cu, Fe, Mg, Pb, P, Sb, Sn, Ti and Zn) is reported. Results showed that element emission responses are dependent upon operating conditions, …

    sheffield-hallam Repository record for Laser induced emission spectrometry for rapid elemental analysis. (opens in a new tab)

  12. Miocene core complex development and coeval supradetachment basin evolution of Paros, Greece

    … of zircons are examined using laser ablation depth-profiling to address the inherent assumption of homogeneous parent nuclide distribution in the zircon (U-Th)/He technique. Results from footwall zircon (U-Th)/He analyses indicate rapid cooling in excess of 100 degrees C/km from 11 - 7 Ma, …

    ku Repository record for Miocene core complex development and coeval supradetachment basin evolution of Paros, Greece (opens in a new tab)

  13. Ferromagnetism of novel ultrathin films and multilayers: A study of Ru/C(0001) and Fe/Mn/Fe/Pd(100) using magneto-optic Kerr effect and spin-sensitive electron spectroscopies

    … for nano-lithography and spin-resolved sputter depth profiling. We use SIMPA and the surface magneto-optic Kerr effect to study exchange coupling in Fe/Mn/Fe/Pd(100) multilayers. The intervening Mn layer is grown in a wedge shape ranging in thickness from 0 to 9 monolayers. Our results show that …

    rice Repository record for Ferromagnetism of novel ultrathin films and multilayers: A study of Ru/C(0001) and Fe/Mn/Fe/Pd(100) using magneto-optic Kerr effect and spin-sensitive electron spectroscopies (opens in a new tab)

  14. Long Chain Molecules in the Molten State: Surface Adsorption, Near Surface Structure, and Mutual-Diffusion

    … time. However, the quantitative application in depth profiling was so far not very successful. The technique is reviewed and procedures that ensure correct extraction of depth profiles from raw SIMS data are discussed.</p>

    cuny-grad Repository record for Long Chain Molecules in the Molten State: Surface Adsorption, Near Surface Structure, and Mutual-Diffusion (opens in a new tab)

  15. Steam oxidation of FeCrAl coated Zircaloy-2

    … and Auger electron spectroscopy (AES) depth profiling was performed. The TGA showed that the coated Zircaloy-2 samples experienced significantly less weight gain as compared to the bare Zircaloy-2 samples, indicating a slower rate of oxidation. AES and XRD showed that at 700 C this …

    uiuc Repository record for Steam oxidation of FeCrAl coated Zircaloy-2 (opens in a new tab)

  16. External proton beam analysis of plasma facing materials for magnetic confinement fusion applications

    … (PIGE) technique was developed for boron depth profiling. In addition, Particle Induced X-ray Emission (PIXE) was implemented and used for a comprehensive study of poloidal tungsten migration in the C-Mod divertor. A novel PIGE technique was developed for measuring depth profiles of boron …

    mit Repository record for External proton beam analysis of plasma facing materials for magnetic confinement fusion applications (opens in a new tab)

  17. The effect of moisture exposure on pretreated aluminum alloys

    … ESCA results. The same conclusion was reached by depth profiling the oxide layer using AES. The rate of increase in the concentration of pseudoboehmite on the surfaces as calculated from FTIR data went in the order 7075 < 5182 < 6061. The activation energy for the third step (transport of soluble …

    vt Repository record for The effect of moisture exposure on pretreated aluminum alloys (opens in a new tab)

  18. Advancing the treatment of relativistic theory within the OLCAO package and with application to solar photovoltaic technologies

    … CH3NH3 and PbBr2 surface models were studied via depth profiling to highlight the influence of the surface effects. The results indicate a shift towards lower energy of the edge onset for Pb-4f and Br-3d atoms in the CH3NH3 surface termination, while the edge onset of Pb-4f and Br-3d does not …

    umkc Repository record for Advancing the treatment of relativistic theory within the OLCAO package and with application to solar photovoltaic technologies (opens in a new tab)

  19. Concentration depth-profile reconstruction from angle-resolved XPS data using the maximum entropy method: characterization of surface film formed on Ni-18P alloy

    A knowledge of the depth concentration profile of materials is very important for research and technological development. Methods reported in the literature are often destructive and/or based on severe approximations; their application is limited to relatively simple profiles (number of components …

    cagliari Repository record for Concentration depth-profile reconstruction from angle-resolved XPS data using the maximum entropy method: characterization of surface film formed on Ni-18P alloy (opens in a new tab)

  20. Process Evaluation and Characterization of Tungsten Nitride as a Diffusion Barrier for Copper Interconnect Technology

    … across a 200 mm diameter Si wafer. Auger depth profiling showed a 2:1 W:N ratio. X-ray diffraction (XRD) showed a broad peak centered on the β-W2N phase. Film resistivity was 270 mohm-cm and film uniformity < 3 %. The step coverage (film thickness variance) across a structured etched …

    unt Repository record for Process Evaluation and Characterization of Tungsten Nitride as a Diffusion Barrier for Copper Interconnect Technology (opens in a new tab)

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