Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 20 of 22 for “"circuit reliability"”.
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Study Of Nanoscale Cmos Device And Circuit Reliability
… performance enhancement. For these devices, the reliability issues are the first concern for the commercialization. The major reliability issues caused by voltage and/or temperature stress are gate oxide breakdown (BD), hot carrier effects (HCs), and negative bias temperature instability (NBTI). …
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Design automation for circuit reliability and energy efficiency
This dissertation presents approaches to improve circuit reliability and energy efficiency from different angles, such as verification, logic synthesis, and functional unit design. A variety of algorithmic methods and heuristics are used in our approaches such as SAT solving, data mining, logic …
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Predictive modeling of device and circuit reliability in highly scaled CMOS and SiGe BiCMOS technology
… has enabled the design of mixed-signal circuits that incorporate analog, RF, and digital circuit components to build cost-effective system-on-a-chip solutions. Emerging applications provide great incentive for continued scaling of transistor performance, requiring careful attention to …
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Study Of Oxide Breakdown, Hot Carrier And Nbti Effects On Mos Device And Circuit Reliability
… cause long term performance drift and related reliability problems in devices and circuits. The RF front-end circuits include low noise amplifier (LNA), local oscillator (LO) and mixer. It is desirable for a LNA to achieve high gain with low noise figure, a LO to generate low noise signal with …
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Probabilistic simulation for reliability analysis of VLSI circuits
… a new technique for simulating integrated circuits, called probabilistic simulation. Using this technique, statistical descriptions of the voltage waveforms at the circuit primary inputs are used to derive corresponding statistical descriptions of the internal voltages and currents. To …
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Modeling and simulation of hot-carrier induced device and circuit degradation for VLSI reliability
… degradation of MOSFET device characteristics and circuit performance. The proposed simulation tool provides information on (i) the evolution of device and circuit performance degradation during long-term dynamic operation, (ii) the amount of hot-carrier induced damage in each transistor after a …
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Ultra-low Voltage Digital Circuits and Extreme Temperature Electronics Design
… first project introduces techniques that improve circuit reliability at deep subthreshold voltages as well as determine the minimum required supply voltage. These techniques address digital electronic design at several levels: the physical process, gate design, and system architecture. This …
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0.3V biopotential sensor interface for stress monitoring
… power-efficiency, and ensures enough circuit reliability with reduced dynamic range requirement. The proposed sensor interface consists of an amplifier and an analog-to-digital converter (ADC). The simulated amplifier achieves 0.95nW power consumption with a power-efficiency-factor …
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Circuit Design And Reliability Of A Cmos Receiver
This dissertation explores CMOS RF design and reliability for portable wireless receivers. The objective behind this research is to achieve an increase in integration level, and gain more understanding for RF reliability. The fields covered include device, circuit and system. What is under …
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Worst case voltage drops in power and ground buses of CMOS VLSI circuits
… the power and ground (P&G) buses of CMOS digital circuits affect both circuit reliability and performance by causing excessive voltage drops. Excessive voltage drops manifest themselves as glitches on the P&G buses and cause erroneous logic signals and degradation in switching speeds. Maximum …
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Fault tolerant, low voltage SRAM design
… made power management a significant concern for circuit designers. Moreover, denser integration and shrinking geometries also have a negative impact on circuit reliability. Therefore, fault tolerance is becoming a more challenging problem. Static Random Access Memories (SRAMs) play a significant …
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Reliable chip design from low powered unreliable components
… the benefits of the technology shrinking due to reliability issues. As VLSI technology scales into nanoscale regime, fundamental physical limits are approached, and higher levels of variability, performance degradation, and higher rates of manufacturing defects are experienced. Soft errors, which …
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Design and Reliability of mm-Wave Circuits In Silicon-Germanium
… a methodology for the design of RF and mm-Wave circuits in Silicon-Germanium utilizing CMOS, PIN diodes, and passive circuits. Such circuits consist of a 2-20 GHz CMOS-based TR (Transmit/Receive) SPDT switch and an 18-47 GHz Wilkinson Power Divider-Combiner (WPDC). Optimal design techniques are …
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Novel methods for post-manufacturing and in-field testing of VLSI circuits/systems
… for the enhancement of in-field testing and circuit reliability. We propose a new dictionary based test data compression method for post-manufacturing testing and we discuss several aspect of the testing procedures, as the reusability of the on-chip decoder for the testing of multiple cores, …
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Gate-Oxide-Short Defect Analysis and Fault Modeling Based on FinFET's 3D Structure
… that primarily capture the behavior of the circuit-under-test by introducing defects at the primary inputs and outputs. It has been found that many defects escape testing when they occur within the circuit structure. Recently, Cell-Aware Test (CAT) has been proposed to detect cell-internal …
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Low-cost error detection through high-level synthesis
… and complexity has resulted in a variety of reliability and validation challenges including logic bugs, hot spots, wear-out, and soft errors. To make matters worse, as we reach the limits of Dennard scaling, efforts to improve system performance and energy efficiency have resulted in the …
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Architecture and CAD techniques for optimizing FPGAs and reliability of integrated circuits.
… is obtained from careful profiling of benchmark circuits. The result is about 30% reduction in leakage power consumption, 5% smaller area and 20% shorter delays, which translates to 25% increase in clock frequency. Despite the increase in clock speeds, the overall power consumption is reduced. …
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Decoding algorithms for continuous phase modulation
… the life of the power source, but it improves circuit reliability since less heat is generated. In some applications, such as satellite transmitters, where power and circuit failure is very expensive, CPM is the most attractive choice. Bandwidth efficiency, also, is very attractive, and …
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Investigation of factors determining charged device model electrostatic discharge reliability of integrated circuits
Submission published under a 24 month embargo labeled 'U of I Access', the embargo will last until 2027-08-01
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3D modeling and integration of current and future interconnect technologies
To ensure maximum circuit reliability it is very important to estimate the circuit performance and signal integrity in the circuit design phase. A full phase simulation for performance estimation of a large-scale circuit not only require a massive computational resource but also need a lot of time …
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