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Showing 1 to 2 of 2 for “"TLP characterization"”.

  1. Evaluation of the practicality of system efficient ESD design

    … test board facilitates transmission line pulse (TLP) characterization of the external pins of an integrated circuit. Models extracted from the data are used to simulate the pin level response of the integrated circuit (IC) to an IEC 61000-4-2 discharge. Electrostatic discharge (ESD) gun zaps are …

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  2. Enhanced modeling methodology for system-level electrostatic discharge simulation

    To enable accurate system-level electrostatic discharge (ESD) simulation, models for the equipment under test, the ESD source, and the environment are required. This work presents advanced modeling methods for the ESD source, the victim IC, and other on-board components, most notably the transient …

    uiuc Repository record for Enhanced modeling methodology for system-level electrostatic discharge simulation (opens in a new tab)