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Showing 1 to 20 of 33 for “"Lifetime prediction"”.

  1. Lifetime Prediction of Geotextiles

    No abstract prepared.

    texas-state Repository record for Lifetime Prediction of Geotextiles (opens in a new tab)

  2. DEFECTS AND LIFETIME PREDICTION OF GERMANIUM MOSFETS

    … the main reliability issues, limiting the device lifetime. In this project, it is found that the conventional lifetime prediction method developed for Si is inapplicable to Ge devicesand defect properties in Ge and Si MOSFETs are different.The threshold voltage degradation in Ge can be nearly 100% …

    liverpool-jm Repository record for DEFECTS AND LIFETIME PREDICTION OF GERMANIUM MOSFETS (opens in a new tab)

  3. Micromechanics-Based Strength and Lifetime Prediction of Polymer Composites

    … issue. Practical and accurate models for lifetime will enable engineers to push the boundaries of design and make the most efficient use of composite materials, while at the same time maintaining the utmost standards of safety. The work described in this dissertation is an effort to …

    vt Repository record for Micromechanics-Based Strength and Lifetime Prediction of Polymer Composites (opens in a new tab)

  4. Lifetime prediction for lithium-ion batteries undergoing fast charging protocols

    … Theory and supervised machine learning to lifetime prediction for 18650 lithium iron phosphate (LiFePO₄ LFP)/graphite cells subject to mixed galvanostatic and potentiostatic fast charging policies. Porous Electrode Theory is used to predict battery lifetime by parameteric reductions of …

    mit Repository record for Lifetime prediction for lithium-ion batteries undergoing fast charging protocols (opens in a new tab)

  5. Bias Temperature Instability Modelling and Lifetime Prediction on Nano-scale MOSFETs

    … during design optimization. An accurate BTI lifetime prediction methodology becomes a prerequisite. Typical BTI lifetime standard is ten years, accelerated BTI tests under high stress voltages are mandatory. BTI modelling is needed to project BTI lifetime from high voltages (accelerated …

    liverpool-jm Repository record for Bias Temperature Instability Modelling and Lifetime Prediction on Nano-scale MOSFETs (opens in a new tab)

  6. Characterization of negative bias temperature instability and lifetime prediction for pMOSFETs

    … rises and becomes a limiting factor for device lifetime. The NBTI can recover significantly during typical measurement time when using conventional instruments. To suppress this recovery, several fast techniques have been developed, including ultra-fast pulse Id-Vgtechnique and the On-The-Fly …

    liverpool-jm Repository record for Characterization of negative bias temperature instability and lifetime prediction for pMOSFETs (opens in a new tab)

  7. Lifetime Prediction and Durability of Elastomeric Seals for Fuel Cell Applications

    … to address the durability and make reliability predictions, the long-term stability of the gaskets in FC assemblies is critical. The aim of this study is to investigate the performance of elastomeric seals in a simulated FC environment in the presence of mechanical stresses. The overall scope of …

    vt Repository record for Lifetime Prediction and Durability of Elastomeric Seals for Fuel Cell Applications (opens in a new tab)

  8. Development of electrical characterization techniques for lifetime prediction and understanding defects in InGaAs-based III-V transistors

    … the NBTI/PBTI and III-V device performance and lifetime prediction issues. For the whole ofthe thesis, it can be divided by 4 chapters to describe the details, the first chapter would be the introduction of background knowledge and current understanding for how the traditional CMOS device works, …

    liverpool-jm Repository record for Development of electrical characterization techniques for lifetime prediction and understanding defects in InGaAs-based III-V transistors (opens in a new tab)

  9. Probing technique for energy distribution of positive charges in gate dielectrics and its application to lifetime prediction

    … to such a level that it is limiting their lifetime. This increase of NBTI is caused mainly by three factors: an increase of nitrogen concentration in gate dielectric, a higher operation electrical field, and a higher temperature. Despite of many years’ research work, there are questions on …

    liverpool-jm Repository record for Probing technique for energy distribution of positive charges in gate dielectrics and its application to lifetime prediction (opens in a new tab)

  10. In situ power-loss estimation of IGBT modules

    A fault detection and prediction method for insulated-gate bipolar transistors (IGBTs) has been improved over the past decades to reduce system downtime. In situ lifetime estimation of IGBT modules has been challenging due to a number of requirements: the necessity to operate at high voltage in the …

    uiuc Repository record for In situ power-loss estimation of IGBT modules (opens in a new tab)

  11. Bridging the Gap: Selected Problems in Model Specification, Estimation, and Optimal Design from Reliability and Lifetime Data Analysis

    Understanding the lifetime behavior of their products is crucial to the success of any company in the manufacturing and engineering industries. Statistical methods for lifetime data are a key component to achieving this level of understanding. Sometimes a statistical procedure must be updated to be …

    vt Repository record for Bridging the Gap: Selected Problems in Model Specification, Estimation, and Optimal Design from Reliability and Lifetime Data Analysis (opens in a new tab)

  12. Reliability and Lifetime Assessment and Enhancement of SIC MOSFETs in an H-ANPC Inverter

    This thesis investigates the lifetime and reliability assessment of power semiconductor devices to address the growing demand for efficient and reliable power converters. Accurate evaluation requires replicating real-world stress conditions, achieved through various Accelerated Tests (ATs). A …

    uic

  13. Modeling And Simulation Of Long Term Degradation And Lifetime Of Deep-submicron Mos Device And Circuit

    … MOS reliability, which can predict the MOS lifetime as a function of drain voltage and channel length. With the further study on physical mechanism of MOS device degradation, experimental results indicated that the widely used power-law model for lifetime estimation is inaccurate for deep …

    ucf

  14. Buried Pipe Life Prediction in Sewage Type Environments

    In this study, we develop a method of life prediction of buried pipe using the concepts of a characteristic damage state and damage accumulation. A stress analysis corresponding to the different types of load during service with environmental effects, a moisture diffusion model, and a lifetime

    vt Repository record for Buried Pipe Life Prediction in Sewage Type Environments (opens in a new tab)

  15. Dynamic Characterization of Wide Bandgap Devices for Power Electronic System Integration

    … Lastly, multi-objective design optimization and lifetime performance evaluation of system-level WBG device integration are applied to demonstrate how dynamic stress insights can be leveraged to optimize overall system performance and develop novel operational lifetime prediction methodologies. …

    vt Repository record for Dynamic Characterization of Wide Bandgap Devices for Power Electronic System Integration (opens in a new tab)

  16. Hot-carrier reliability of MOSFETs at room and cryogenic temperature

    … and its implications in terms of the device lifetime prediction procedure. As geometry scaling approaches the physical limit of fabrication techniques, such as photolithography, temperature scaling becomes a more viable alternative. MOSFET performance enhancement has been investigated and …

    mit Repository record for Hot-carrier reliability of MOSFETs at room and cryogenic temperature (opens in a new tab)

  17. Analysis and Modeling of the Mechanical Durability of Proton Exchange Membranes Using Pressure-Loaded Blister Tests

    … damage accumulation and residual strength based lifetime prediction models. Robust models, validated by successfully predicting fatigue failures, suggest the ability to predict failures under any given stress history whether mechanically or environmentally induced - a critical step in the effort …

    vt Repository record for Analysis and Modeling of the Mechanical Durability of Proton Exchange Membranes Using Pressure-Loaded Blister Tests (opens in a new tab)

  18. Lifetime predictions of medium voltage motor coil insulation when operated by PWM from SiC inverters.

    … increased stress for all parts of the machine lifetime including the winding insulation. To this end, it has already been observed that traditional understandings of insulation lifetime originally developed for Si inverter operation are ill-equipped for the greater stresses provided by WBG …

    baylor Repository record for Lifetime predictions of medium voltage motor coil insulation when operated by PWM from SiC inverters. (opens in a new tab)

  19. Statistical modeling and simulation of variability and reliability of CMOS technology

    … is small, yet significant in the device lifetime prediction. In order to accurately estimate the total guard band necessary for a variation aware Integrated Circuit design, process induced time-zero variation and different aging effects need to be considered simultaneously. In addition, …

    purdue-thes Repository record for Statistical modeling and simulation of variability and reliability of CMOS technology (opens in a new tab)

  20. A model to predict the lifetime of pneumatic conveyor bends

    … thesis describes an attempt to enable improved prediction of bend-wear and bend lifetime, so that more cost-effective survey work can be undertaken in anticipation of bursts. This work delivers a tool that allows bend lifetime prediction to be made according to: the bend geometry and material; …

    greenwich Repository record for A model to predict the lifetime of pneumatic conveyor bends (opens in a new tab)

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