Image degradation due to diffraction, reflection, and scattering in an optical system

The focal plane power distribution due to a bright source is analyzed for an infrared imaging optical system. Irradiance from the bright source is spread throughout the focal plane according to the characteristics of the system. This effect is attributed to diffraction, reflection and scattering in the optical train. Expected focal plane power distributions due to diffraction and multiple reflections between dielectric surfaces are calculated and compared to measured data. The difference is attributed to scatter characteristics of the optical elements. A brief overview of the major sources of scatter lays groundwork for a further analysis of scattering characteristics in the optical system.

Name thesis:degree_name

Master of Science

Level thesis:degree_level

masters

Discipline thesis:degree_discipline

Electrical Engineering

Department dc:contributor.department

Electrical Engineering

Grantor dc:publisher

Virginia Polytechnic Institute and State University

Year dc:date.issued

1987

Author dc:creator

• Zadnik, Jerome A.

Statement dc:rights

• In Copyright

Licence dc:rights.uri

• http://rightsstatements.org/vocab/InC/1.0/

Language dc:language.iso

en_US

Handle dc:identifier.uri

http://hdl.handle.net/10919/80064

OAI identifier oai:identifier

oai:vtechworks.lib.vt.edu:10919/80064