{"id":{"repo_id":"vt","oai_identifier":"oai:vtechworks.lib.vt.edu:10919/80064"},"canonical_url":"https://search.dev.ndltd.org/etd/vt/oai:vtechworks.lib.vt.edu:10919/80064","repository":{"repo_id":"vt","name":"Virginia Tech","base_url":"https://vtechworks.lib.vt.edu/oai/request"},"display":{"title":"Image degradation due to diffraction, reflection, and scattering in an optical system","abstract":"The focal plane power distribution due to a bright source is analyzed for an infrared imaging optical system. Irradiance from the bright source is spread throughout the focal plane according to the characteristics of the system. This effect is attributed to diffraction, reflection and scattering in the optical train. Expected focal plane power distributions due to diffraction and multiple reflections between dielectric surfaces are calculated and compared to measured data. The difference is attributed to scatter characteristics of the optical elements. 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A brief overview of the major sources of scatter lays groundwork for a further analysis of scattering characteristics in the optical system.","abstract_has_math":false,"creators":["Zadnik, Jerome A."],"institution":"Virginia Polytechnic Institute and State University","degree_name":"Master of Science","degree_level":"masters","degree_discipline":"Electrical Engineering","degree_department":"Electrical Engineering","school":null,"contributors":[],"advisors":[],"committee_chairs":[],"committee_members":[],"year":1987,"date_issued":"1987","date_published":"1987","updated_at":"2026-07-22T22:19:26Z","subjects":[],"languages":["en_US"],"rights":["In Copyright"],"rights_urls":["http://rightsstatements.org/vocab/InC/1.0/"],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/10919/80064","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.department","label":"Department","values":["Electrical Engineering"]},{"key":"dc:creator","label":"Author","values":["Zadnik, Jerome A."]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2017-11-09T20:41:41Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2017-11-09T20:41:41Z"]},{"key":"dc:date.issued","label":"Date","values":["1987"]},{"key":"dc:publisher","label":"Institution","values":["Virginia Polytechnic Institute and State University"]},{"key":"dc:type","label":"Dc Type","values":["Thesis"]},{"key":"dc:type.dcmitype","label":"Dc Type Dcmitype","values":["Text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["masters"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Master of Science"]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["Virginia Polytechnic Institute and State University"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language.iso","label":"Language (ISO)","values":["en_US"]},{"key":"dc:rights","label":"Dc Rights","values":["In Copyright"]},{"key":"dc:rights.uri","label":"Rights URI","values":["http://rightsstatements.org/vocab/InC/1.0/"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.uri","label":"Identifier URI","values":["http://hdl.handle.net/10919/80064"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["The focal plane power distribution due to a bright source is analyzed for an infrared imaging optical system. Irradiance from the bright source is spread throughout the focal plane according to the characteristics of the system. This effect is attributed to diffraction, reflection and scattering in the optical train. Expected focal plane power distributions due to diffraction and multiple reflections between dielectric surfaces are calculated and compared to measured data. The difference is attributed to scatter characteristics of the optical elements. 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This effect is attributed to diffraction, reflection and scattering in the optical train. Expected focal plane power distributions due to diffraction and multiple reflections between dielectric surfaces are calculated and compared to measured data. The difference is attributed to scatter characteristics of the optical elements. 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