A Study of the Sampling Process in the Dc Biased Dynamic Crossed Field Electron Multiplier

Leverenz, Donald James

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University of Illinois at Urbana-Champaign

A Study of the Sampling Process in the Dc Biased Dynamic Crossed Field Electron Multiplier

dc:creator Leverenz, Donald James

thesis:degree_name Ph.D.

dc:date2014

Abstract

dc:description

Made available in DSpace on 2014-12-09T19:52:29Z (GMT). No. of bitstreams: 1 7013390.pdf: 4591753 bytes, checksum: ffb6d4b80b70aba3b159ee47b8265287 (MD5) Previous issue date: 1969

Degree

thesis:*

Name thesis:degree_name: Ph.D.
Level thesis:degree_level: Dissertation
Discipline thesis:degree_discipline: Nuclear Engineering
Grantor: University of Illinois at Urbana-Champaign
Year dc:date: 2014

Author and committee

dc:creator, dc:contributor.*

Author dc:creator: Leverenz, Donald James

Subjects

dc:subject × 1

Engineering, Nuclear

Identifiers

dc:identifier.*

Identifier: (UMI)AAI7013390
OAI identifier oai:identifier: oai:www.ideals.illinois.edu:2142/61247

Chain of custody

source

Harvested from: University of Illinois - Urbana-Champaign
Base URL: www.ideals.illinois.edu/oai-pmh
Last updated: 2026-07-22
Source record: OAI-PMH GetRecord

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citation

Leverenz, Donald James. A Study of the Sampling Process in the Dc Biased Dynamic Crossed Field Electron Multiplier. Dissertation thesis, University of Illinois at Urbana-Champaign, 2014. http://hdl.handle.net/2142/61247

A Study of the Sampling Process in the Dc Biased Dynamic Crossed Field Electron Multiplier

Abstract

Degree

Author and committee

Subjects

Identifiers

Chain of custody

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