A Study of the Sampling Process in the Dc Biased Dynamic Crossed Field Electron Multiplier
type: CreativeWork
description: Made available in DSpace on 2014-12-09T19:52:29Z (GMT). No. of bitstreams: 1 7013390.pdf: 4591753 bytes, checksum: ffb6d4b80b70aba3b159ee47b8265287 (MD5) Previous issue date: 1969
abstract: Made available in DSpace on 2014-12-09T19:52:29Z (GMT). No. of bitstreams: 1 7013390.pdf: 4591753 bytes, checksum: ffb6d4b80b70aba3b159ee47b8265287 (MD5) Previous issue date: 1969
author: Leverenz, Donald James
keywords: Engineering, Nuclear
date published: 2014-12-09T19:52:29Z
date modified: 2026-07-22T22:25:48Z
provider: University of Illinois - Urbana-Champaign
publisher: Networked Digital Library of Theses and Dissertations
type: WebPage
source organization: University of Illinois at Urbana-Champaign

PropertyValue
property ID: Handle
value: http://hdl.handle.net/2142/61247