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University of Illinois - Urbana-Champaign

Compositional order and structure of epitaxial thin film semiconductors by x-ray diffraction

Abstract

dc:description

Submitted by William Weathers (weathrs2@illinois.edu) on 2012-05-04T18:50:05Z No. of bitstreams: 1 1997_whiteaker.pdf: 3692358 bytes, checksum: 74f0dd77aeb74f74dcc4c5ff9e287289 (MD5)

Degree

thesis:*
Name thesis:degree_name
Ph.D.
Level thesis:degree_level
Dissertation
Discipline thesis:degree_discipline
Physics
Year dc:date
2012

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Whiteaker, Kevin Lloyd
Contributors dc:contributor
  • Robinson, Ian K.

Subjects

dc:subject × 2

Rights

dc:rights
Statement dc:rights
  • ©1997 Whiteaker
Language dc:language
en

Identifiers

dc:identifier.*
Identifier
4048931
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/30805

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Whiteaker, Kevin Lloyd. Compositional order and structure of epitaxial thin film semiconductors by x-ray diffraction. Dissertation thesis, 2012. http://hdl.handle.net/2142/30805