Compositional order and structure of epitaxial thin film semiconductors by x-ray diffraction
type: CreativeWork
description: Submitted by William Weathers (weathrs2@illinois.edu) on 2012-05-04T18:50:05Z No. of bitstreams: 1 1997_whiteaker.pdf: 3692358 bytes, checksum: 74f0dd77aeb74f74dcc4c5ff9e287289 (MD5)
abstract: Submitted by William Weathers (weathrs2@illinois.edu) on 2012-05-04T18:50:05Z No. of bitstreams: 1 1997_whiteaker.pdf: 3692358 bytes, checksum: 74f0dd77aeb74f74dcc4c5ff9e287289 (MD5)
author: Whiteaker, Kevin Lloyd
language: en
keywords: epitaxial thin film semiconductors, x-ray diffraction
date published: 2012-05-04T18:50:05Z
date modified: 2026-07-22T22:25:29Z
provider: University of Illinois - Urbana-Champaign
publisher: Networked Digital Library of Theses and Dissertations
type: WebPage
source organization: University of Illinois - Urbana-Champaign

PropertyValue
property ID: Handle
value: http://hdl.handle.net/2142/30805