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University of Illinois - Urbana-Champaign
Study of electron mobility and scattering in weak surface inversion layer on silicon
Abstract
dc:descriptionItem marked as restricted to the 'UIUC Users [automated]' Group (id=2) by Carolyn Mead (cmead2@illinois.edu) on 2011-07-01T14:42:40Z Item is restricted indefinitely.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Physics
- Year dc:date
- 2011
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Shiue, Chyan-Chang
- Contributors dc:contributor
-
- Sah, C.T.
Subjects
dc:subject × 7Rights
dc:rights- Statement dc:rights
-
- 1977 Chyan-Chang Shiue
- Language dc:language
- en
Identifiers
dc:identifier.*- Identifier
- 311472
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/25610