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Universität Oldenburg

Investigation of opto-electronical properties of DC magnetron sputtered ZnO:Al films with respect to the layer thickness, annealing temperature and resistance inhomogeneity

Abstract

dc:description.abstract

Investigation of opto-electronical properties of DC magnetron sputtered ZnO:Al films with respect to the layer thickness, annealing temperature and resistance inhomogeneity

Degree

thesis:*
Level thesis:degree_level
master
Grantor dc:publisher
Universität Oldenburg
Year
2011

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Nowak, Regina-Elisabeth

Subjects

dc:subject × 1

Identifiers

dc:identifier.*
Repository record source_url
http://oops.uni-oldenburg.de/1218
OAI identifier oai:identifier
oai:oops.uni-oldenburg.de:1218

Chain of custody

source
Harvested from
Carl von Ossietzky Universität Oldenburg
Base URL
oops.uni-oldenburg.de/cgi/oai2
Last updated
2026-07-27
Source record
OAI-PMH GetRecord
citation

Nowak, Regina-Elisabeth. Investigation of opto-electronical properties of DC magnetron sputtered ZnO:Al films with respect to the layer thickness, annealing temperature and resistance inhomogeneity. master thesis, Universität Oldenburg, 2011. http://oops.uni-oldenburg.de/1218