Van Der Pauw Hall Effect and Resistivity Characterization of Gan Thin Films

The van der Pauw Hall Effect and Resistivity measurement procedure is the most popular method used for determining the electrical properties of a semiconductor. With this method it is possible to tell what carrier types are present in a thin film, and what their concentrations and mobilities are. This will, in the end, help the researcher know how best to grow semiconductor thin films with certain desired electrical properties. In this thesis, a newly refurbished system is described, and results from subsequent experiments are offered. These results demonstrate the expected temperature dependencies of the electrical properties of GaN thin films, and serve as an indication for future research directions.

Name thesis:degree_name

Master of Science in Materials Science

Level thesis:degree_level

Masters

Discipline thesis:degree_discipline

Physics, Astronomy, and Materials Science

Year

2000

Author dc:creator

• Porter, Hugh

Contributors dc:contributor

• Shyang Hwang

• Materials Science and Engineering

Statement dc:rights

• © Hugh Porter

Repository record dc:identifier

https://bearworks.missouristate.edu/theses/837

OAI identifier oai:identifier

oai:bearworks.missouristate.edu:theses-1838