{"id":{"repo_id":"mo-state","oai_identifier":"oai:bearworks.missouristate.edu:theses-1838"},"canonical_url":"https://search.dev.ndltd.org/etd/mo-state/oai:bearworks.missouristate.edu:theses-1838","repository":{"repo_id":"mo-state","name":"Missouri State University","base_url":"https://bearworks.missouristate.edu/do/oai/"},"display":{"title":"Van Der Pauw Hall Effect and Resistivity Characterization of Gan Thin Films","abstract":"The van der Pauw Hall Effect and Resistivity measurement procedure is the most popular method used for determining the electrical properties of a semiconductor. With this method it is possible to tell what carrier types are present in a thin film, and what their concentrations and mobilities are. This will, in the end, help the researcher know how best to grow semiconductor thin films with certain desired electrical properties. In this thesis, a newly refurbished system is described, and results from subsequent experiments are offered. These results demonstrate the expected temperature dependencies of the electrical properties of GaN thin films, and serve as an indication for future research directions.","abstract_html":"The van der Pauw Hall Effect and Resistivity measurement procedure is the most popular method used for determining the electrical properties of a semiconductor. With this method it is possible to tell what carrier types are present in a thin film, and what their concentrations and mobilities are. This will, in the end, help the researcher know how best to grow semiconductor thin films with certain desired electrical properties. In this thesis, a newly refurbished system is described, and results from subsequent experiments are offered. These results demonstrate the expected temperature dependencies of the electrical properties of GaN thin films, and serve as an indication for future research directions.","abstract_has_math":false,"creators":["Porter, Hugh"],"institution":null,"degree_name":"Master of Science in Materials Science","degree_level":"Masters","degree_discipline":"Physics, Astronomy, and Materials Science","degree_department":null,"school":null,"contributors":["Shyang Hwang"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2000,"date_issued":"2000-05-01T07:00:00Z","date_published":"2000-05-01T07:00:00Z","updated_at":"2026-07-24T03:15:54Z","subjects":["Materials Science and Engineering"],"languages":[],"rights":["© Hugh Porter"],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"https://bearworks.missouristate.edu/theses/837","outbound_label":"Repository record","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Shyang Hwang"]},{"key":"dc:creator","label":"Author","values":["Porter, Hugh"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"thesis:degree_discipline","label":"Discipline","values":["Physics, Astronomy, and Materials Science"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Masters"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Master of Science in Materials Science"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Materials Science and Engineering"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:rights","label":"Dc Rights","values":["© Hugh Porter"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["https://bearworks.missouristate.edu/theses/837"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["The van der Pauw Hall Effect and Resistivity measurement procedure is the most popular method used for determining the electrical properties of a semiconductor. With this method it is possible to tell what carrier types are present in a thin film, and what their concentrations and mobilities are. This will, in the end, help the researcher know how best to grow semiconductor thin films with certain desired electrical properties. In this thesis, a newly refurbished system is described, and results from subsequent experiments are offered. These results demonstrate the expected temperature dependencies of the electrical properties of GaN thin films, and serve as an indication for future research directions."]},{"key":"dc:title","label":"Title","values":["Van Der Pauw Hall Effect and Resistivity Characterization of Gan Thin Films"]}]}],"canonical_facts":{"dc:contributor":["Shyang Hwang"],"dc:creator":["Porter, Hugh"],"dc:description.abstract":["The van der Pauw Hall Effect and Resistivity measurement procedure is the most popular method used for determining the electrical properties of a semiconductor. With this method it is possible to tell what carrier types are present in a thin film, and what their concentrations and mobilities are. This will, in the end, help the researcher know how best to grow semiconductor thin films with certain desired electrical properties. In this thesis, a newly refurbished system is described, and results from subsequent experiments are offered. These results demonstrate the expected temperature dependencies of the electrical properties of GaN thin films, and serve as an indication for future research directions."],"dc:identifier":["https://bearworks.missouristate.edu/theses/837"],"dc:rights":["© Hugh Porter"],"dc:subject":["Materials Science and Engineering"],"dc:title":["Van Der Pauw Hall Effect and Resistivity Characterization of Gan Thin Films"],"thesis:degree_discipline":["Physics, Astronomy, and Materials Science"],"thesis:degree_level":["Masters"],"thesis:degree_name":["Master of Science in Materials Science"]},"updated_at":"2026-07-24T03:15:54Z"}