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West Virginia University

Electrical characterization of thin film nanostructure templates

Abstract

dc:description.abstract

An improved apparatus for anodizing aluminum films on Si substrates is presented. In addition, an explanation is given for adapting the system to SiC and glass substrates. The system presented is optimized for throughput and safety to focus on volume production. MOS capacitors created with the system are analyzed with capacitance-voltage measurement techniques to provide insight into device operation. Ni is deposited into porous alumina templates to create Ni nanostructures.

Degree

thesis:*
Name thesis:degree_name
MS
Level thesis:degree_level
Thesis
Discipline thesis:degree_discipline
Lane Department of Computer Science and Electrical Engineering
Year dc:date.available
2001

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Garman, Christopher James
Contributors dc:contributor
  • Biswajit Das.

Subjects

dc:subject × 1

Identifiers

dc:identifier.*
OAI identifier oai:identifier
oai:researchrepository.wvu.edu:etd-2194

Chain of custody

source
Harvested from
West Virginia University
Base URL
researchrepository.wvu.edu/do/oai/
Last updated
2026-07-24
Source record
OAI-PMH GetRecord
citation

Garman, Christopher James. Electrical characterization of thin film nanostructure templates. Thesis thesis, 2001. https://doi.org/10.33915/etd.1191