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Virginia Tech

STM Study of Interfaces and Defects in 2D Materials

Abstract

dc:description.abstract

Two-dimensional (2D) materials show novel electronic, optical and chemical properties and have great potential in devices such as field-effect transistors (FET), photodetectors and gas sensors. This thesis focuses on scanning tunneling microscopy and spectroscopy (STM/STS) investigation of interfaces and defects 2D transition metal dichalcogenides (TMDCs). The first part of the thesis focuses on the synthesis of 2D TiSe2 with chemical vapor transport (CVT). By properly choosing the growth condition, Sub-10 nm TiSe2 flakes were successfully obtained. A 2 × 2 charge density wave (CDW) was clearly observed on these ultrathin flakes by scanning tunneling microscopy (STM). Accurate CDW phase transition temperature was measured by transport measurements. This work opens up a new approach to synthesize TMDCs. The second part of the thesis focuses on monolayer vacancy islands growing on TiSe2 surface under electrical stressing. We have observed nonlinear area evolution and growth from triangular to hexagonal driven by STM subjected electrical stressing. Our simulations of monolayer island evolution using phase-field modeling and first-principles calculations are in good agreement with our experimental observations. The results could be potentially important for device reliability in systems containing ultrathin TMDCs and related 2D materials subject to electrical stressing. The third part of the thesis focuses on point defects in 2D PtSe2. We observed five types of distinct defects from STM topography images and measured the local density of states (LDOS) of those defects from scanning tunneling spectroscopy (STS). We identified the types and characteristics of these defects with the first-principles calculations. Our findings would provide critical insight into tuning of carrier mobility, charge carrier relaxation, and electron-hole recombination rates by defect engineering or varying growth condition in few-layer 1T-PtSe2 and other related 2D materials.

Degree

thesis:*
Name thesis:degree_name
Doctor of Philosophy
Level thesis:degree_level
doctoral
Discipline thesis:degree_discipline
Physics
Department dc:contributor.department
Physics
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
2020

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Zheng, Husong
Chair dc:contributor.committeechair
  • Tao, Chenggang
Committee members dc:contributor.committeemember
  • Robinson, Hans D.
  • Heflin, James R.
  • Park, Kyungwha

Subjects

dc:subject × 3

Rights

dc:rights
Statement dc:rights
  • In Copyright

Identifiers

dc:identifier.*
Dc Identifier Other
vt_gsexam:24401
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/97440

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Zheng, Husong. STM Study of Interfaces and Defects in 2D Materials. doctoral thesis, Virginia Tech, 2020. http://hdl.handle.net/10919/97440