{"id":{"repo_id":"vt","oai_identifier":"oai:vtechworks.lib.vt.edu:10919/90932"},"canonical_url":"https://search.dev.ndltd.org/etd/vt/oai:vtechworks.lib.vt.edu:10919/90932","repository":{"repo_id":"vt","name":"Virginia Tech","base_url":"https://vtechworks.lib.vt.edu/oai/request"},"display":{"title":"Functional fault modeling and test vector development for VLSI systems","abstract":"The attempts at classification of functional faults in VLSI chips have not been very successful in the past. The problem is blown out of proportions because methods used for testing have not evolved at the same pace as the technology. The fault-models proposed for LSI systems are no longer capable of testing VLSI devices efficiently. Thus the stuck-at and short/open fault models are outdated. Despite this fact, these old models are used in the industry with some modifications. Also, these gate-level fault models are very time-consuming and costly to run on the mainframe computers. In this thesis, a new method is developed for fault modeling at the functional level. This new method called 'Model Perturbation' is shown to be very simple and viable for automation. Some general sets of rules are established for fault selection and insertion. Based on the functional fault model introduced, a method of test vector development is formulated. Finally, the results obtained from functional fault simulation are related to gate level coverage. The validity and simplicity of using these models for combinational and sequential VLSI circuits is discussed. As an example, the modeling of IBM's AMAC chip, the work on which was done under contract YD 190121, is described.","abstract_html":"The attempts at classification of functional faults in VLSI chips have not been very successful in the past. The problem is blown out of proportions because methods used for testing have not evolved at the same pace as the technology. The fault-models proposed for LSI systems are no longer capable of testing VLSI devices efficiently. Thus the stuck-at and short/open fault models are outdated. Despite this fact, these old models are used in the industry with some modifications. Also, these gate-level fault models are very time-consuming and costly to run on the mainframe computers. In this thesis, a new method is developed for fault modeling at the functional level. This new method called 'Model Perturbation' is shown to be very simple and viable for automation. Some general sets of rules are established for fault selection and insertion. Based on the functional fault model introduced, a method of test vector development is formulated. Finally, the results obtained from functional fault simulation are related to gate level coverage. The validity and simplicity of using these models for combinational and sequential VLSI circuits is discussed. As an example, the modeling of IBM's AMAC chip, the work on which was done under contract YD 190121, is described.","abstract_has_math":false,"creators":["Gupta, Anil K."],"institution":"Virginia Polytechnic Institute and State University","degree_name":"M.S.","degree_level":"masters","degree_discipline":"Electrical Engineering","degree_department":"Electrical Engineering","school":null,"contributors":[],"advisors":[],"committee_chairs":[],"committee_members":[],"year":1985,"date_issued":"1985","date_published":"1985","updated_at":"2026-07-22T22:20:37Z","subjects":[],"languages":["en_US"],"rights":["In Copyright"],"rights_urls":["http://rightsstatements.org/vocab/InC/1.0/"],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/10919/90932","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.department","label":"Department","values":["Electrical Engineering"]},{"key":"dc:creator","label":"Author","values":["Gupta, Anil K."]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2019-07-03T16:42:37Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2019-07-03T16:42:37Z"]},{"key":"dc:date.issued","label":"Date","values":["1985"]},{"key":"dc:publisher","label":"Institution","values":["Virginia Polytechnic Institute and State University"]},{"key":"dc:type","label":"Dc Type","values":["Thesis"]},{"key":"dc:type.dcmitype","label":"Dc Type Dcmitype","values":["Text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["masters"]},{"key":"thesis:degree_name","label":"Degree Name","values":["M.S."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["Virginia Polytechnic Institute and State University"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language.iso","label":"Language (ISO)","values":["en_US"]},{"key":"dc:rights","label":"Dc Rights","values":["In Copyright"]},{"key":"dc:rights.uri","label":"Rights URI","values":["http://rightsstatements.org/vocab/InC/1.0/"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.uri","label":"Identifier URI","values":["http://hdl.handle.net/10919/90932"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["The attempts at classification of functional faults in VLSI chips have not been very successful in the past. The problem is blown out of proportions because methods used for testing have not evolved at the same pace as the technology. The fault-models proposed for LSI systems are no longer capable of testing VLSI devices efficiently. Thus the stuck-at and short/open fault models are outdated. Despite this fact, these old models are used in the industry with some modifications. Also, these gate-level fault models are very time-consuming and costly to run on the mainframe computers. In this thesis, a new method is developed for fault modeling at the functional level. This new method called 'Model Perturbation' is shown to be very simple and viable for automation. Some general sets of rules are established for fault selection and insertion. Based on the functional fault model introduced, a method of test vector development is formulated. Finally, the results obtained from functional fault simulation are related to gate level coverage. The validity and simplicity of using these models for combinational and sequential VLSI circuits is discussed. As an example, the modeling of IBM's AMAC chip, the work on which was done under contract YD 190121, is described."]},{"key":"dc:description.degree","label":"Dc Description Degree","values":["M.S."]},{"key":"dc:format.mimetype","label":"Dc Format Mimetype","values":["application/pdf"]},{"key":"dc:title","label":"Title","values":["Functional fault modeling and test vector development for VLSI systems"]}]}],"canonical_facts":{"dc:contributor.department":["Electrical Engineering"],"dc:creator":["Gupta, Anil K."],"dc:date.accessioned":["2019-07-03T16:42:37Z"],"dc:date.available":["2019-07-03T16:42:37Z"],"dc:date.issued":["1985"],"dc:description.abstract":["The attempts at classification of functional faults in VLSI chips have not been very successful in the past. The problem is blown out of proportions because methods used for testing have not evolved at the same pace as the technology. The fault-models proposed for LSI systems are no longer capable of testing VLSI devices efficiently. Thus the stuck-at and short/open fault models are outdated. Despite this fact, these old models are used in the industry with some modifications. Also, these gate-level fault models are very time-consuming and costly to run on the mainframe computers. In this thesis, a new method is developed for fault modeling at the functional level. This new method called 'Model Perturbation' is shown to be very simple and viable for automation. Some general sets of rules are established for fault selection and insertion. Based on the functional fault model introduced, a method of test vector development is formulated. Finally, the results obtained from functional fault simulation are related to gate level coverage. 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