An I/O algorithm and a test algorithm for a reconfigurable cellular array

Recent advances in VLSI technology have stimulated research efforts in the area of highly reliable fault tolerant, general purpose computing systems, notably, parallel systems. An automatically reconfigurable, fault-tolerant, parallel architecture is suited to VLSI technology. The architecture, a uniformly interconnected array of identical cells, is capable of functional reconfiguration as well as fault reconfiguration. Microprocessor cells are suggested as the "fabric" for implementation of the array. This thesis also introduces an I/O algorithm as an extension to the reconfiguration process, and outlines the steps by which the array cells construct paths from the active-array to the cellular array I/O ports. Path reconfiguration is presented as the method by which fault-free paths replace faulty paths. A testing algorithm is described for use in the self-testing operation of the array. The types of tests that are conducted on cells are outlined, and the basis by which a cell determines the faulty or fault-free status of a cell is described.

Name thesis:degree_name

M.S.

Level thesis:degree_level

masters

Discipline thesis:degree_discipline

Electrical Engineering

Department dc:contributor.department

Electrical Engineering

Grantor dc:publisher

Virginia Polytechnic Institute and State University

Year dc:date.issued

1985

Author dc:creator

• Connell, Kathleen L.

Statement dc:rights

• In Copyright

Licence dc:rights.uri

• http://rightsstatements.org/vocab/InC/1.0/

Language dc:language.iso

en_US

Handle dc:identifier.uri

http://hdl.handle.net/10919/90927

OAI identifier oai:identifier

oai:vtechworks.lib.vt.edu:10919/90927