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Virginia Tech

Ensemble Modelling of in situ Feature Variables for Printed Electronics Manufacturing with in situ Process Control Potential

Abstract

dc:description.abstract

Aerosol Jet® Printing (AJP) is a direct-write based additive manufacturing process that is capable of printing electronics with fine features and various materials. It eliminates the complex masking process in traditional semiconductor manufacturing, thus enables flexible electronics design and reduces manufacturing cost. However, the quality control of AJP processes is still a challenging problem, primarily due to the lack of understanding of the potential root causes of the quality issues. There is a complex interaction among process setting variables, in situ feature variables, and quality variables in AJP processes. In this research, an ensemble model strategy is proposed to quantify the effect of the process setting variables on the in situ feature variables, and the effect of the in situ feature variables on quality variables in a two-level hierarchical way. By identifying significant in situ feature variables as responses for the process setting variables, as well as predictors for product quality in a joint estimation problem, the proposed models have a hierarchical variable relationship to enable in situ process control for variation reduction and defect mitigation. A real case study is investigated to demonstrate the advantages of the proposed method.

Degree

thesis:*
Name thesis:degree_name
Master of Science
Level thesis:degree_level
masters
Discipline thesis:degree_discipline
Industrial and Systems Engineering
Department dc:contributor.department
Industrial and Systems Engineering
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
2017

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Mohan, Karuniya
Chair dc:contributor.committeechair
  • Jin, Ran
Committee members dc:contributor.committeemember
  • Johnson, Blake
  • Sarin, Subhash C.

Subjects

dc:subject × 5

Rights

dc:rights
Statement dc:rights
  • In Copyright

Identifiers

dc:identifier.*
Dc Identifier Other
vt_gsexam:9987
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/84947

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Mohan, Karuniya. Ensemble Modelling of in situ Feature Variables for Printed Electronics Manufacturing with in situ Process Control Potential. masters thesis, Virginia Tech, 2017. http://hdl.handle.net/10919/84947