{"id":{"repo_id":"vt","oai_identifier":"oai:vtechworks.lib.vt.edu:10919/80100"},"canonical_url":"https://search.dev.ndltd.org/etd/vt/oai:vtechworks.lib.vt.edu:10919/80100","repository":{"repo_id":"vt","name":"Virginia Tech","base_url":"https://vtechworks.lib.vt.edu/oai/request"},"display":{"title":"A novel approach to calculating relative scattering parameter sensitivity in computer-aided design programs","abstract":"Relative sensitivity is a measure of the percentage change in a system parameter caused by a percentage change in a component parameter. The adjoint network method has previously been used by Monaco and Tiberio in the computation of relative scattering parameter sensitivity. A new approach is presented in this work which defines a bilinear equation and three constants that relate any component scattering parameter to any system scattering parameter. A computer-aided design program which implements this relative sensitivity in analysis and optimization is presented. Circuit analysis examples demonstrating sensitivity analysis and optimization are included. As a background for this work, computer-aided design concepts, such as network modeling, objective functions, Rosenbrock's optimization method, and the adjoint network method for estimating partial derivatives, are also presented.","abstract_html":"Relative sensitivity is a measure of the percentage change in a system parameter caused by a percentage change in a component parameter. The adjoint network method has previously been used by Monaco and Tiberio in the computation of relative scattering parameter sensitivity. A new approach is presented in this work which defines a bilinear equation and three constants that relate any component scattering parameter to any system scattering parameter. A computer-aided design program which implements this relative sensitivity in analysis and optimization is presented. Circuit analysis examples demonstrating sensitivity analysis and optimization are included. 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