{"id":{"repo_id":"vt","oai_identifier":"oai:vtechworks.lib.vt.edu:10919/64694"},"canonical_url":"https://search.dev.ndltd.org/etd/vt/oai:vtechworks.lib.vt.edu:10919/64694","repository":{"repo_id":"vt","name":"Virginia Tech","base_url":"https://vtechworks.lib.vt.edu/oai/request"},"display":{"title":"Stress intensity factors for long, deep surface flaws in plates under extentional fields","abstract":"Using a singular solution for a part circular crack by F. W. Smith, a Taylor Series Correction Method (TSCM) was verified for extracting stress intensity factors from photoelastic data. Photoelastic experiments were then conducted on plates with part circular and flat bottomed cracks for flaw depth to thickness ratios of 0.25, 0.50 and 0.75 and for equivalent flaw depth to equivalent ellipse length values ranging from 0.066 to 0.319. Experimental results agreed well with the Smith theory but indicated that the use of the \"equivalent\" semi-elliptical flaw for correlating the part circular flaw results with semi-elliptical flaw results was not valid for a/2c<< 0.20. Best overall agreement for the moderate (a/t ≃ 0.5) to deep flaws (a/t ≃ 0.75) and a/2c > 0.15 was found with a semi-empirical theory due to J. C. Newman when compared on the basis of equivalent flaw depth and area. The Smith theory, when correlated on the basis of flaw depth and area, appears to yield reasonable estimates (within 10%) of the SIF for flat bottomed flaws for the geometries studied here.","abstract_html":"Using a singular solution for a part circular crack by F. W. Smith, a Taylor Series Correction Method (TSCM) was verified for extracting stress intensity factors from photoelastic data. Photoelastic experiments were then conducted on plates with part circular and flat bottomed cracks for flaw depth to thickness ratios of 0.25, 0.50 and 0.75 and for equivalent flaw depth to equivalent ellipse length values ranging from 0.066 to 0.319. Experimental results agreed well with the Smith theory but indicated that the use of the &quot;equivalent&quot; semi-elliptical flaw for correlating the part circular flaw results with semi-elliptical flaw results was not valid for a/2c&lt;&lt; 0.20. Best overall agreement for the moderate (a/t ≃ 0.5) to deep flaws (a/t ≃ 0.75) and a/2c &gt; 0.15 was found with a semi-empirical theory due to J. C. Newman when compared on the basis of equivalent flaw depth and area. The Smith theory, when correlated on the basis of flaw depth and area, appears to yield reasonable estimates (within 10%) of the SIF for flat bottomed flaws for the geometries studied here.","abstract_has_math":false,"creators":["Harms, Alan E."],"institution":"Virginia Polytechnic Institute and State University","degree_name":"Master of Science","degree_level":"masters","degree_discipline":"Engineering Science and Mechanics","degree_department":"Engineering Science and Mechanics","school":null,"contributors":[],"advisors":[],"committee_chairs":[],"committee_members":[],"year":1973,"date_issued":"1973","date_published":"1973","updated_at":"2026-07-24T05:56:46Z","subjects":[],"languages":["en"],"rights":["In Copyright"],"rights_urls":["http://rightsstatements.org/vocab/InC/1.0/"],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/10919/64694","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.department","label":"Department","values":["Engineering Science and Mechanics"]},{"key":"dc:creator","label":"Author","values":["Harms, Alan E."]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2016-02-01T18:05:39Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2016-02-01T18:05:39Z"]},{"key":"dc:date.issued","label":"Date","values":["1973"]},{"key":"dc:publisher","label":"Institution","values":["Virginia Polytechnic Institute and State University"]},{"key":"dc:type","label":"Dc Type","values":["Thesis"]},{"key":"dc:type.dcmitype","label":"Dc Type Dcmitype","values":["Text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Engineering Science and Mechanics"]},{"key":"thesis:degree_level","label":"Degree Level","values":["masters"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Master of Science"]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["Virginia Polytechnic Institute and State University"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language.iso","label":"Language (ISO)","values":["en"]},{"key":"dc:rights","label":"Dc Rights","values":["In Copyright"]},{"key":"dc:rights.uri","label":"Rights URI","values":["http://rightsstatements.org/vocab/InC/1.0/"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.uri","label":"Identifier URI","values":["http://hdl.handle.net/10919/64694"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["Using a singular solution for a part circular crack by F. W. Smith, a Taylor Series Correction Method (TSCM) was verified for extracting stress intensity factors from photoelastic data. Photoelastic experiments were then conducted on plates with part circular and flat bottomed cracks for flaw depth to thickness ratios of 0.25, 0.50 and 0.75 and for equivalent flaw depth to equivalent ellipse length values ranging from 0.066 to 0.319. Experimental results agreed well with the Smith theory but indicated that the use of the \"equivalent\" semi-elliptical flaw for correlating the part circular flaw results with semi-elliptical flaw results was not valid for a/2c<< 0.20. Best overall agreement for the moderate (a/t ≃ 0.5) to deep flaws (a/t ≃ 0.75) and a/2c > 0.15 was found with a semi-empirical theory due to J. C. Newman when compared on the basis of equivalent flaw depth and area. The Smith theory, when correlated on the basis of flaw depth and area, appears to yield reasonable estimates (within 10%) of the SIF for flat bottomed flaws for the geometries studied here."]},{"key":"dc:description.degree","label":"Dc Description Degree","values":["Master of Science"]},{"key":"dc:format.mimetype","label":"Dc Format Mimetype","values":["application/pdf"]},{"key":"dc:title","label":"Title","values":["Stress intensity factors for long, deep surface flaws in plates under extentional fields"]}]}],"canonical_facts":{"dc:contributor.department":["Engineering Science and Mechanics"],"dc:creator":["Harms, Alan E."],"dc:date.accessioned":["2016-02-01T18:05:39Z"],"dc:date.available":["2016-02-01T18:05:39Z"],"dc:date.issued":["1973"],"dc:description.abstract":["Using a singular solution for a part circular crack by F. W. Smith, a Taylor Series Correction Method (TSCM) was verified for extracting stress intensity factors from photoelastic data. Photoelastic experiments were then conducted on plates with part circular and flat bottomed cracks for flaw depth to thickness ratios of 0.25, 0.50 and 0.75 and for equivalent flaw depth to equivalent ellipse length values ranging from 0.066 to 0.319. Experimental results agreed well with the Smith theory but indicated that the use of the \"equivalent\" semi-elliptical flaw for correlating the part circular flaw results with semi-elliptical flaw results was not valid for a/2c<< 0.20. Best overall agreement for the moderate (a/t ≃ 0.5) to deep flaws (a/t ≃ 0.75) and a/2c > 0.15 was found with a semi-empirical theory due to J. C. Newman when compared on the basis of equivalent flaw depth and area. The Smith theory, when correlated on the basis of flaw depth and area, appears to yield reasonable estimates (within 10%) of the SIF for flat bottomed flaws for the geometries studied here."],"dc:description.degree":["Master of Science"],"dc:format.mimetype":["application/pdf"],"dc:identifier.uri":["http://hdl.handle.net/10919/64694"],"dc:language.iso":["en"],"dc:publisher":["Virginia Polytechnic Institute and State University"],"dc:rights":["In Copyright"],"dc:rights.uri":["http://rightsstatements.org/vocab/InC/1.0/"],"dc:title":["Stress intensity factors for long, deep surface flaws in plates under extentional fields"],"dc:type":["Thesis"],"dc:type.dcmitype":["Text"],"thesis:degree_discipline":["Engineering Science and Mechanics"],"thesis:degree_level":["masters"],"thesis:degree_name":["Master of Science"],"thesis:institution_name":["Virginia Polytechnic Institute and State University"]},"updated_at":"2026-07-24T05:56:46Z"}