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Virginia Tech

Spectral domain interferometry: A high-sensitivity, high-speed approach to quantitative phase imaging

Abstract

dc:description.abstract

Many biological specimens are transparent and in weak intensity contrast, making it invisible using conventional bright field microscopes. Therefore, the phase-based optical microscopy techniques play important roles in the development of the modern biomedical science. Furthermore, the ability to achieve quantitative phase measurement of the tiny structures of biomedical specimens is of great importance for many biomedical applications. Thus, quantitative phase imaging becomes an important technique to measure the phase variations due to the difference of refractive index and geometric thickness of various structures and materials within the biomedical specimens. In this thesis, a spectral modulation interferometry (SMI) is developed to achieve quantitative phase imaging. In SMI, the phase and amplitude information will simultaneously be modulated onto the interference spectrum of the broadband light. Full-field phase images can be obtained by scanning along the orthogonal direction only. SMI incorporates the advantages of low coherence from broadband light source, high sensitivity from spectral domain interferometry and the high speed from the spectral modulation technique to achieve quantitative phase measurement with free of speckle, high temporal sensitivity (~0.1nm) and fast imaging rate. The principles of SMI system and programming as well as some important image processing methods will be discussed in detail. Besides, the quantitative phase measurement of the reflective object (USAF resolution target) and the transmitted biological objects (Peranema, human cheek cells) will be shown.

Degree

thesis:*
Name thesis:degree_name
Master of Science
Level thesis:degree_level
masters
Discipline thesis:degree_discipline
Electrical Engineering
Department dc:contributor.department
Electrical and Computer Engineering
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
2015

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Shang, Ruibo
Chair dc:contributor.committeechair
  • Zhu, Yizheng
Committee members dc:contributor.committeemember
  • Xu, Yong
  • Agah, Masoud

Subjects

dc:subject × 4

Rights

dc:rights
Statement dc:rights
  • In Copyright

Identifiers

dc:identifier.*
Dc Identifier Other
vt_gsexam:5665
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/54001

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Shang, Ruibo. Spectral domain interferometry: A high-sensitivity, high-speed approach to quantitative phase imaging. masters thesis, Virginia Tech, 2015. http://hdl.handle.net/10919/54001