Dielectric characterization using a Wideband Dielectric Filled Cavity (WDFC)

This dissertation summarizes the research performed towards the development, analysis, and testing of two new sample configurations used for characterizing dielectric materials over a wide band of frequencies. In the two configurations, a cylindrical cavity completely filled with a sample of the dielectric material of interest is used. The two configurations are the following: 1. The cylindrical cavity is adapted to the end of a transmission line and the reflection coefficient is measured. The complex permittivity of the dielectric sample is then derived from the measured reflection coefficient information. 2. The cylindrical cavity is placed between two transmission lines. The complex permittivity of the dielectric material can be computed from either the measured reflection coefficient or the measured transmission coefficient. The full field analysis of these configurations is carried out and the solution is obtained using the method of moments. Computer simulation experiments are performed to test the sensitivity of these techniques and predict their performance. Actual experiments on some dielectric materials with known dielectric properties are performed for verification. The first configuration is also used to characterize two thick film dielectric materials. These configurations proved to provide solutions to the many problems with the conventional configurations found in the literature.

Name thesis:degree_name

Ph. D.

Level thesis:degree_level

doctoral

Discipline thesis:degree_discipline

Electrical Engineering

Department dc:contributor.department

Electrical Engineering

Grantor dc:publisher

Virginia Polytechnic Institute and State University

Year dc:date.issued

1987

Author dc:creator

• Saed, Mohammed Ali

Chair dc:contributor.committeechair

• Riad, Sedki

Committee members dc:contributor.committeemember

• Besieris, Ioannis M.
• Brown, Gary
• Davis, William A.
• Elshabini-Riad, Aicha A.
• Riess, R. Dean

Statement dc:rights

• In Copyright

Licence dc:rights.uri

• http://rightsstatements.org/vocab/InC/1.0/

Language dc:language.iso

en_US

Handle dc:identifier.uri

http://hdl.handle.net/10919/52317

OAI identifier oai:identifier

oai:vtechworks.lib.vt.edu:10919/52317