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Virginia Tech

Novel Architectures for Trace Buffer Design to facilitate Post-Silicon Validation and Test

Abstract

dc:description.abstract

Post-Silicon validation is playing an increasingly important role as more chips are failing in the functional mode due to either manufacturing defects escaped during scan-based tests or design bugs missed during pre-silicon validation. Critical to the diagnosis engineer is the ability to observe as many relevant internal signal values as possible during debug. To do so, trace buffers have been proposed for enhancing the observability of internal signals during post-silicon debug. Trace Buffers are used to trace (record the values of) the internal signals in real-time when chip is in its normal operation. However, existing trace buffer architectures trace very few signals for a large number of cycles. Thus, even with a good subset of signals traced, one often still cannot restore all the relevant values in the circuit. In this work, we propose two different flexible trace buffer architectures that can restore the values for all signals by making the trace signals configurable. In addition, the buffer space can also be shared among different traced signals which makes the architectures highly flexible. As compared to conventional trace buffer architectures, the new architectures have comparable area overhead but offer the ability to restore all signals in the circuit. For cases of less than 100% restoration, the ability of circuit invariants to improve the signal restoration is explored. A promising direction for the future work is provided where targeted invariants may lead to better restoration scenario during post-silicon validation.

Degree

thesis:*
Name thesis:degree_name
Master of Science
Level thesis:degree_level
masters
Discipline thesis:degree_discipline
Computer Engineering
Department dc:contributor.department
Electrical and Computer Engineering
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
2014

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Pandit, Shuchi
Chair dc:contributor.committeechair
  • Hsiao, Michael S.
Committee members dc:contributor.committeemember
  • Abbott, A. Lynn
  • Wang, Chao

Subjects

dc:subject × 3

Rights

dc:rights
Statement dc:rights
  • In Copyright

Identifiers

dc:identifier.*
Dc Identifier Other
vt_gsexam:3114
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/49151

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Pandit, Shuchi. Novel Architectures for Trace Buffer Design to facilitate Post-Silicon Validation and Test. masters thesis, Virginia Tech, 2014. http://hdl.handle.net/10919/49151