{"id":{"repo_id":"vt","oai_identifier":"oai:vtechworks.lib.vt.edu:10919/46437"},"canonical_url":"https://search.dev.ndltd.org/etd/vt/oai:vtechworks.lib.vt.edu:10919/46437","repository":{"repo_id":"vt","name":"Virginia Tech","base_url":"https://vtechworks.lib.vt.edu/oai/request"},"display":{"title":"Selection of flip-flops for partial scan paths by use of a statistical testability measure","abstract":"Partial scan paths improve the testability of digital circuits, and incur minimal costs in the area overhead and test application time. Design constraints may require that a partial scan path include only those flip-flops that provide the greatest improvements in circuit testability. STAFFS, a tool that identifies such flip-flops, has been developed. It uses a statistical testability measure to acquire quantitative data for the controllabilities and observabilities of the nodes of a circuit. It predicts the changes that would occur in the data due to the scanning of specific flip-flops, and uses those predictions to select flip-flops. STAFFS weights the observability data versus the controllability data when selecting flip-flops, and it can efficiently select alternative scan designs for different weights. Experimental results for thirteen sequential benchmark circuits reveal that STAFFS consistently selects scan designs with fault coverages that are significantly higher than those of arbitrarily selected scan designs.","abstract_html":"Partial scan paths improve the testability of digital circuits, and incur minimal costs in the area overhead and test application time. Design constraints may require that a partial scan path include only those flip-flops that provide the greatest improvements in circuit testability. STAFFS, a tool that identifies such flip-flops, has been developed. It uses a statistical testability measure to acquire quantitative data for the controllabilities and observabilities of the nodes of a circuit. It predicts the changes that would occur in the data due to the scanning of specific flip-flops, and uses those predictions to select flip-flops. STAFFS weights the observability data versus the controllability data when selecting flip-flops, and it can efficiently select alternative scan designs for different weights. Experimental results for thirteen sequential benchmark circuits reveal that STAFFS consistently selects scan designs with fault coverages that are significantly higher than those of arbitrarily selected scan designs.","abstract_has_math":false,"creators":["Jett, David B."],"institution":"Virginia Tech","degree_name":"Master of Science","degree_level":"masters","degree_discipline":"Electrical Engineering","degree_department":"Electrical Engineering","school":null,"contributors":[],"advisors":[],"committee_chairs":[],"committee_members":["Ha, Dong Sam","Tront, Joseph G.","Midkiff, Scott F."],"year":1992,"date_issued":"1992-09-05","date_published":"1992-09-05","updated_at":"2026-07-22T22:19:18Z","subjects":[],"languages":["en"],"rights":["In Copyright"],"rights_urls":["http://rightsstatements.org/vocab/InC/1.0/"],"identifier_entries":[{"key":"dc:identifier.other","label":"Dc Identifier Other","values":["etd-12302008-063234"],"render_values":[{"text":"etd-12302008-063234","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/10919/46437","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.committeemember","label":"Committee Member","values":["Ha, Dong Sam","Tront, Joseph G.","Midkiff, Scott F."]},{"key":"dc:contributor.department","label":"Department","values":["Electrical Engineering"]},{"key":"dc:creator","label":"Author","values":["Jett, David B."]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2014-03-14T21:52:39Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2014-03-14T21:52:39Z","2008-12-30"]},{"key":"dc:date.issued","label":"Date","values":["1992-09-05"]},{"key":"dc:publisher","label":"Institution","values":["Virginia Tech"]},{"key":"dc:type","label":"Dc Type","values":["Thesis"]},{"key":"dc:type.dcmitype","label":"Dc Type Dcmitype","values":["Text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["masters"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Master of Science"]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["Virginia Polytechnic Institute and State University"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language.iso","label":"Language (ISO)","values":["en"]},{"key":"dc:rights","label":"Dc Rights","values":["In Copyright"]},{"key":"dc:rights.uri","label":"Rights URI","values":["http://rightsstatements.org/vocab/InC/1.0/"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.other","label":"Dc Identifier Other","values":["etd-12302008-063234"]},{"key":"dc:identifier.uri","label":"Identifier URI","values":["http://hdl.handle.net/10919/46437"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["Partial scan paths improve the testability of digital circuits, and incur minimal costs in the area overhead and test application time. Design constraints may require that a partial scan path include only those flip-flops that provide the greatest improvements in circuit testability. STAFFS, a tool that identifies such flip-flops, has been developed. It uses a statistical testability measure to acquire quantitative data for the controllabilities and observabilities of the nodes of a circuit. It predicts the changes that would occur in the data due to the scanning of specific flip-flops, and uses those predictions to select flip-flops. STAFFS weights the observability data versus the controllability data when selecting flip-flops, and it can efficiently select alternative scan designs for different weights. Experimental results for thirteen sequential benchmark circuits reveal that STAFFS consistently selects scan designs with fault coverages that are significantly higher than those of arbitrarily selected scan designs."]},{"key":"dc:description.degree","label":"Dc Description Degree","values":["Master of Science"]},{"key":"dc:format.medium","label":"Dc Format Medium","values":["BTD"]},{"key":"dc:format.mimetype","label":"Dc Format Mimetype","values":["application/pdf"]},{"key":"dc:title","label":"Title","values":["Selection of flip-flops for partial scan paths by use of a statistical testability measure"]}]}],"canonical_facts":{"dc:contributor.committeemember":["Ha, Dong Sam","Tront, Joseph G.","Midkiff, Scott F."],"dc:contributor.department":["Electrical Engineering"],"dc:creator":["Jett, David B."],"dc:date.accessioned":["2014-03-14T21:52:39Z"],"dc:date.available":["2014-03-14T21:52:39Z","2008-12-30"],"dc:date.issued":["1992-09-05"],"dc:description.abstract":["Partial scan paths improve the testability of digital circuits, and incur minimal costs in the area overhead and test application time. 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