Virginia Tech
Reliability diagnostic strategies for series systems under imperfect testing
Abstract
dc:description.abstractAn expected cost model was developed for failure detection in series systems under imperfect testing. Type I and type II error probabilities are included and single-pass sample paths are required. The model accounts for the expected costs of testing components, false positive termination, and no-defect-found outcomes. Based on the model, a heuristic was developed to construct the cost minimizing testing sequence. The heuristic algorithm utilizes elementary arithmetic computations and has been successfully applied to a variety of problems. Furthermore, the algorithm appears to be globally convergent. Choice of a starting solution affects the rate of convergence, and guidelines for selecting the starting solution were discussed. Implementation of the heuristic was illustrated by numerical example.
Degree
thesis:*- Name thesis:degree_name
- Master of Science
- Level thesis:degree_level
- masters
- Discipline thesis:degree_discipline
- Industrial Engineering and Operations Research
- Department dc:contributor.department
- Industrial Engineering and Operations Research
- Grantor dc:publisher
- Virginia Tech
- Year dc:date.issued
- 1987
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Reller, Susan R.
- Chair dc:contributor.committeechair
-
- Nachlas, Joel A.
- Committee members dc:contributor.committeemember
-
- Blanchard, Benjamin S. Jr.
- Rakes, Terry R.
- Sarin, Subhash C.
Rights
dc:rights- Statement dc:rights
-
- In Copyright
- Licence dc:rights.uri
Identifiers
dc:identifier.*- Dc Identifier Other
- etd-11202012-040315
- OAI identifier oai:identifier
- oai:vtechworks.lib.vt.edu:10919/45926