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Virginia Tech

Transient fault detection using a watchdog processor

Abstract

dc:description.abstract

Microprocessors are used in many applications where a high degree of reliability is required. For instance, satellite based systems operating in space have no way being serviced if something were goes wrong. Often these systems, operating in radiation environments, are subject to random high energy particles that pass through the device and upset the operation of the microprocessor for a short period but leave no permanent damage. These transient faults are difficult to predict, prevent, or detect but can lead to a system failure if not discovered.

Degree

thesis:*
Name thesis:degree_name
Master of Science
Level thesis:degree_level
masters
Discipline thesis:degree_discipline
Electrical Engineering
Department dc:contributor.department
Electrical Engineering
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
1993

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Becker, Brian Alan
Chair dc:contributor.committeechair
  • Tront, Joseph G.
Committee members dc:contributor.committeemember
  • Armstrong, James R.
  • Ha, Dong Sam

Rights

dc:rights
Statement dc:rights
  • In Copyright
Language dc:language.iso
en

Identifiers

dc:identifier.*
Dc Identifier Other
etd-11102009-020108
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/45599

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
related terms
citation

Becker, Brian Alan. Transient fault detection using a watchdog processor. masters thesis, Virginia Tech, 1993. http://hdl.handle.net/10919/45599