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Virginia Tech

Hazard detection with VHDL in combinational logic circuits with fixed delays

Abstract

dc:description.abstract

Timing hazards are common problems found in logic circuits. A new integrated hazard detection system (HDS), which is implemented in VHDL, is proposed to detect the static, the dynamic, and the function hazards in any logic circuit that is described structurally in VHDL. This system adopts the IEEE VHDL Model Standard Group 1076-1164 Nine-Valued Multiple-Valued Logic package. Without any designer-supplied arbitrary input test patterns, the system predicts which input combinations will cause hazards, reports what type of hazards, and provides detailed timing information on the hazards in the combinational logic circuit with fixed gate delays.

Degree

thesis:*
Name thesis:degree_name
Master of Science
Level thesis:degree_level
masters
Discipline thesis:degree_discipline
Electrical Engineering
Department dc:contributor.department
Electrical Engineering
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
1992

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Chu, Ming-Cheung
Chair dc:contributor.committeechair
  • Armstrong, James R.
Committee members dc:contributor.committeemember
  • Gray, Festus Gail
  • Ha, Dong Sam

Rights

dc:rights
Statement dc:rights
  • In Copyright
Language dc:language.iso
en

Identifiers

dc:identifier.*
Dc Identifier Other
etd-10062009-020040
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/45005

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
related terms
citation

Chu, Ming-Cheung. Hazard detection with VHDL in combinational logic circuits with fixed delays. masters thesis, Virginia Tech, 1992. http://hdl.handle.net/10919/45005