Test generation for behavioral models with reconvergent fanout and feed-back

In this thesis, new methods to handle reconvergent fanout and feed-back during behavioral level test generation are proposed. These methods have been implemented - into a previously developed automatic test generator. The improved test generator was tested on five behavioral circuit models. For circuits with the reconvergent fanout situation, the improved test generator can generate tests completely automatically. For circuits with feed-back, user assistance in a circuit initialization step is required. Some suggestions for future development for the test generator are discussed. Examples on how to use the improved test generator are presented.

Name thesis:degree_name

Master of Science

Level thesis:degree_level

masters

Discipline thesis:degree_discipline

Electrical Engineering

Department dc:contributor.department

Electrical Engineering

Grantor dc:publisher

Virginia Tech

Year dc:date.issued

1989

Author dc:creator

• Lam, Fong-Shek

Chair dc:contributor.committeechair

• Armstrong, James R.

Committee members dc:contributor.committeemember

• Midkiff, Scott F.
• Tront, Joseph G.

Statement dc:rights

• In Copyright

Licence dc:rights.uri

• http://rightsstatements.org/vocab/InC/1.0/

Language dc:language.iso

en

Dc Identifier Other

etd-07242012-040138

OAI identifier oai:identifier

oai:vtechworks.lib.vt.edu:10919/43900