{"id":{"repo_id":"vt","oai_identifier":"oai:vtechworks.lib.vt.edu:10919/43745"},"canonical_url":"https://search.dev.ndltd.org/etd/vt/oai:vtechworks.lib.vt.edu:10919/43745","repository":{"repo_id":"vt","name":"Virginia Tech","base_url":"https://vtechworks.lib.vt.edu/oai/request"},"display":{"title":"Mimic circuit simulation in real time","abstract":"An algorithm is derived for the removal of the DC offset from a faulted current signal using a microprocessor sampling on real-time. The algorithm is to be used instead of the analog Mimic circuit in distance computer relaying. Four variations of the algorithm were derived and tested to determine the best compromise between time response and noise sensitivity. The relay hardware is taken into consideration for the derivations to avoid adding any hardware to the relay. The graphical results of the test run in an analog simulator at the Virginia Tech Power Systems Laboratory are presented. Faults at different voltage angles were performed to determine the algorithm's performance at different levels of DC offset. From the graphical response obtained from the test and taking into consideration hardware and software limitations, a preferred algorithm is selected with a good compromise between time response and noise sensitivity.","abstract_html":"An algorithm is derived for the removal of the DC offset from a faulted current signal using a microprocessor sampling on real-time. The algorithm is to be used instead of the analog Mimic circuit in distance computer relaying. Four variations of the algorithm were derived and tested to determine the best compromise between time response and noise sensitivity. The relay hardware is taken into consideration for the derivations to avoid adding any hardware to the relay. The graphical results of the test run in an analog simulator at the Virginia Tech Power Systems Laboratory are presented. Faults at different voltage angles were performed to determine the algorithm&#x27;s performance at different levels of DC offset. From the graphical response obtained from the test and taking into consideration hardware and software limitations, a preferred algorithm is selected with a good compromise between time response and noise sensitivity.","abstract_has_math":false,"creators":["Centeno, Virgilio A."],"institution":"Virginia Tech","degree_name":"Master of Science","degree_level":"masters","degree_discipline":"Electrical Engineering","degree_department":"Electrical Engineering","school":null,"contributors":[],"advisors":[],"committee_chairs":["Phadke, Arun G."],"committee_members":["Rahman, Saifur","De La Ree, Jaime"],"year":1988,"date_issued":"1988-06-10","date_published":"1988-06-10","updated_at":"2026-07-22T22:18:42Z","subjects":[],"languages":[],"rights":["In Copyright"],"rights_urls":["http://rightsstatements.org/vocab/InC/1.0/"],"identifier_entries":[{"key":"dc:identifier.other","label":"Dc Identifier Other","values":["etd-07152010-020234"],"render_values":[{"text":"etd-07152010-020234","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/10919/43745","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.committeechair","label":"Committee Chair","values":["Phadke, Arun G."]},{"key":"dc:contributor.committeemember","label":"Committee Member","values":["Rahman, Saifur","De La Ree, Jaime"]},{"key":"dc:contributor.department","label":"Department","values":["Electrical Engineering"]},{"key":"dc:creator","label":"Author","values":["Centeno, Virgilio A."]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2014-03-14T21:40:32Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2014-03-14T21:40:32Z","2010-07-15"]},{"key":"dc:date.issued","label":"Date","values":["1988-06-10"]},{"key":"dc:publisher","label":"Institution","values":["Virginia Tech"]},{"key":"dc:type","label":"Dc Type","values":["Thesis"]},{"key":"dc:type.dcmitype","label":"Dc Type Dcmitype","values":["Text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["masters"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Master of Science"]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["Virginia Polytechnic Institute and State University"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:rights","label":"Dc Rights","values":["In Copyright"]},{"key":"dc:rights.uri","label":"Rights URI","values":["http://rightsstatements.org/vocab/InC/1.0/"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.other","label":"Dc Identifier Other","values":["etd-07152010-020234"]},{"key":"dc:identifier.uri","label":"Identifier URI","values":["http://hdl.handle.net/10919/43745"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["An algorithm is derived for the removal of the DC offset from a faulted current signal using a microprocessor sampling on real-time. 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