{"id":{"repo_id":"vt","oai_identifier":"oai:vtechworks.lib.vt.edu:10919/43309"},"canonical_url":"https://search.dev.ndltd.org/etd/vt/oai:vtechworks.lib.vt.edu:10919/43309","repository":{"repo_id":"vt","name":"Virginia Tech","base_url":"https://vtechworks.lib.vt.edu/oai/request"},"display":{"title":"On the design of reconfigurable ripple carry adders and carry save multipliers","abstract":"The fault location and reconfigurable designs of Ripple Carry (RC) adders and Carry Save (CS) multipliers are studied in this thesis. The proposed designs can locate a faulty cell and reconfigure the faulty array to tolerate the faulty cell. Laser programming technique is used for fault location and reconfiguration. The key idea employed in the proposed methods is to perform diagnosis and reconfiguration at the same time. Appropriate fuses are programmed to locate a faulty cell, and the programmed fuses are also used for reconfiguration. This leads to small area overhead, and hence, substantial improvement in yield. Experimental results show that the yield enhancement of reconfigurable RC adders and CS multipliers is substantial compared with that of original RC adders and CS multipliers, respectively.","abstract_html":"The fault location and reconfigurable designs of Ripple Carry (RC) adders and Carry Save (CS) multipliers are studied in this thesis. The proposed designs can locate a faulty cell and reconfigure the faulty array to tolerate the faulty cell. Laser programming technique is used for fault location and reconfiguration. The key idea employed in the proposed methods is to perform diagnosis and reconfiguration at the same time. Appropriate fuses are programmed to locate a faulty cell, and the programmed fuses are also used for reconfiguration. This leads to small area overhead, and hence, substantial improvement in yield. Experimental results show that the yield enhancement of reconfigurable RC adders and CS multipliers is substantial compared with that of original RC adders and CS multipliers, respectively.","abstract_has_math":false,"creators":["Jang, Yi-Feng"],"institution":"Virginia Tech","degree_name":"Master of Science","degree_level":"masters","degree_discipline":"Electrical Engineering","degree_department":"Electrical Engineering","school":null,"contributors":[],"advisors":[],"committee_chairs":["Ha, Dong Sam"],"committee_members":["Gray, Festus Gail","Davis, Nathaniel J. IV"],"year":1992,"date_issued":"1992-01-05","date_published":"1992-01-05","updated_at":"2026-07-22T22:20:32Z","subjects":[],"languages":["en"],"rights":["In Copyright"],"rights_urls":["http://rightsstatements.org/vocab/InC/1.0/"],"identifier_entries":[{"key":"dc:identifier.other","label":"Dc Identifier Other","values":["etd-06162009-063006"],"render_values":[{"text":"etd-06162009-063006","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/10919/43309","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.committeechair","label":"Committee Chair","values":["Ha, Dong Sam"]},{"key":"dc:contributor.committeemember","label":"Committee Member","values":["Gray, Festus Gail","Davis, Nathaniel J. IV"]},{"key":"dc:contributor.department","label":"Department","values":["Electrical Engineering"]},{"key":"dc:creator","label":"Author","values":["Jang, Yi-Feng"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2014-03-14T21:38:30Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2014-03-14T21:38:30Z","2009-06-16"]},{"key":"dc:date.issued","label":"Date","values":["1992-01-05"]},{"key":"dc:publisher","label":"Institution","values":["Virginia Tech"]},{"key":"dc:type","label":"Dc Type","values":["Thesis"]},{"key":"dc:type.dcmitype","label":"Dc Type Dcmitype","values":["Text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["masters"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Master of Science"]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["Virginia Polytechnic Institute and State University"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language.iso","label":"Language (ISO)","values":["en"]},{"key":"dc:rights","label":"Dc Rights","values":["In Copyright"]},{"key":"dc:rights.uri","label":"Rights URI","values":["http://rightsstatements.org/vocab/InC/1.0/"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.other","label":"Dc Identifier Other","values":["etd-06162009-063006"]},{"key":"dc:identifier.uri","label":"Identifier URI","values":["http://hdl.handle.net/10919/43309"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["The fault location and reconfigurable designs of Ripple Carry (RC) adders and Carry Save (CS) multipliers are studied in this thesis. The proposed designs can locate a faulty cell and reconfigure the faulty array to tolerate the faulty cell. Laser programming technique is used for fault location and reconfiguration. The key idea employed in the proposed methods is to perform diagnosis and reconfiguration at the same time. Appropriate fuses are programmed to locate a faulty cell, and the programmed fuses are also used for reconfiguration. This leads to small area overhead, and hence, substantial improvement in yield. Experimental results show that the yield enhancement of reconfigurable RC adders and CS multipliers is substantial compared with that of original RC adders and CS multipliers, respectively."]},{"key":"dc:description.degree","label":"Dc Description Degree","values":["Master of Science"]},{"key":"dc:format.medium","label":"Dc Format Medium","values":["BTD"]},{"key":"dc:format.mimetype","label":"Dc Format Mimetype","values":["application/pdf"]},{"key":"dc:title","label":"Title","values":["On the design of reconfigurable ripple carry adders and carry save multipliers"]}]}],"canonical_facts":{"dc:contributor.committeechair":["Ha, Dong Sam"],"dc:contributor.committeemember":["Gray, Festus Gail","Davis, Nathaniel J. IV"],"dc:contributor.department":["Electrical Engineering"],"dc:creator":["Jang, Yi-Feng"],"dc:date.accessioned":["2014-03-14T21:38:30Z"],"dc:date.available":["2014-03-14T21:38:30Z","2009-06-16"],"dc:date.issued":["1992-01-05"],"dc:description.abstract":["The fault location and reconfigurable designs of Ripple Carry (RC) adders and Carry Save (CS) multipliers are studied in this thesis. The proposed designs can locate a faulty cell and reconfigure the faulty array to tolerate the faulty cell. Laser programming technique is used for fault location and reconfiguration. The key idea employed in the proposed methods is to perform diagnosis and reconfiguration at the same time. Appropriate fuses are programmed to locate a faulty cell, and the programmed fuses are also used for reconfiguration. This leads to small area overhead, and hence, substantial improvement in yield. Experimental results show that the yield enhancement of reconfigurable RC adders and CS multipliers is substantial compared with that of original RC adders and CS multipliers, respectively."],"dc:description.degree":["Master of Science"],"dc:format.medium":["BTD"],"dc:format.mimetype":["application/pdf"],"dc:identifier.other":["etd-06162009-063006"],"dc:identifier.uri":["http://hdl.handle.net/10919/43309"],"dc:language.iso":["en"],"dc:publisher":["Virginia Tech"],"dc:rights":["In Copyright"],"dc:rights.uri":["http://rightsstatements.org/vocab/InC/1.0/"],"dc:title":["On the design of reconfigurable ripple carry adders and carry save multipliers"],"dc:type":["Thesis"],"dc:type.dcmitype":["Text"],"thesis:degree_discipline":["Electrical Engineering"],"thesis:degree_level":["masters"],"thesis:degree_name":["Master of Science"],"thesis:institution_name":["Virginia Polytechnic Institute and State University"]},"updated_at":"2026-07-22T22:20:32Z"}