An intelligent workstation for reliable residual stress determination using x-ray diffraction

Recent hardware developments of automated, high speed, portable X-ray diffraction instrumentation have not yet resulted in widespread use of the technique in industry despite its potentials. We suggest that these hardware developments require an equivalent development in the training of instrument operators in order to guarantee the integrity of the resulting data, as well as to enhance the understanding of such materials characterization data. The hurdle to date is the variety of skills necessary in a wide range of scientific and engineering disciplines and which are not commonly found in a single individual. We suggest that a computer-based system, integrating visualization tools, knowledge bases and analysis-capabilities and which is focused on the operator performance can provide an efficient solution to this problem, as it changes the enactment of the stress determination work process.

Name thesis:degree_name

Master of Science

Level thesis:degree_level

masters

Discipline thesis:degree_discipline

Materials Engineering

Department dc:contributor.department

Materials Engineering

Grantor dc:publisher

Virginia Tech

Year dc:date.issued

1989

Author dc:creator

• Dehan, Christophe F.

Chair dc:contributor.committeechair

• Hendricks, Robert Wayne

Committee members dc:contributor.committeemember

• Dowling, Norman E.
• Roach, John W.

Statement dc:rights

• In Copyright

Licence dc:rights.uri

• http://rightsstatements.org/vocab/InC/1.0/

Language dc:language.iso

en

Dc Identifier Other

etd-06102012-040457

OAI identifier oai:identifier

oai:vtechworks.lib.vt.edu:10919/43086