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Virginia Tech
The effects of moving electron density fluctuations on time domain reflectometry in plasmas
Abstract
dc:description.abstractThe effects of time-dependent electron density fluctuations on a synthesized time domain reflectometry response of a one-dimensional cold plasma sheath are considered. Numerical solutions of the Helmholtz wave equation, which describes the electric field of a normally incident plane wave in a specified static electron density profile, are used. Included in this work is a study of the effects of Doppler shifts resulting from moving density fluctuations in the electron density profile of the sheath.
Degree
thesis:*- Name thesis:degree_name
- Master of Science
- Level thesis:degree_level
- masters
- Discipline thesis:degree_discipline
- Electrical Engineering
- Department dc:contributor.department
- Electrical Engineering
- Grantor dc:publisher
- Virginia Tech
- Year dc:date.issued
- 1991
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Scherner, Michael J.
Rights
dc:rights- Statement dc:rights
-
- In Copyright
- Licence dc:rights.uri
- Language dc:language.iso
- en
Identifiers
dc:identifier.*- Dc Identifier Other
- etd-03172010-020634
- OAI identifier oai:identifier
- oai:vtechworks.lib.vt.edu:10919/41717