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Virginia Tech

A multiple stress, multiple component stress screening cost model

Abstract

dc:description.abstract

Environmental stress screening is used to enhance reliability by decreasing the number of failures experienced during customer use. It is suggested that added benefit can be gained by applying multiple stresses rather than a single stress, as is done presently. A further modification is to apply the stress at the assembly level, accelerating different types of components at the same time. Different component E A e acceleration effects must then be considered. The problem these modifications present is how to choose the appropriate stress levels and the time duration of the stress screen. A cost model is developed that trades off the cost of a field failure with the cost of applying a multiple stress, multiple component stress screen. The objective is to minimize this cost function in order to find an economical stress regimen. The problem is solved using the software package GINO. The interesting result is that if a stress is used at all during the stress screen, the maximum amount of stress is the economic choice. Either the cost of stressing is low enough to justify the use of a stress, in which case the maximum amount of stress is used, or the cost is too high and the stress is not used at all.

Degree

thesis:*
Name thesis:degree_name
Master of Science
Level thesis:degree_level
masters
Discipline thesis:degree_discipline
Industrial Engineering and Operations Research
Department dc:contributor.department
Industrial Engineering and Operations Research
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
1985

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Seward, Lori Welte
Chair dc:contributor.committeechair
  • Nachlas, Joel A.
Committee members dc:contributor.committeemember
  • Reynolds, Marion R. Jr.
  • Sherali, Hanif D.

Rights

dc:rights
Statement dc:rights
  • In Copyright

Identifiers

dc:identifier.*
Dc Identifier Other
etd-03122013-040311
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/41578

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
related terms
citation

Seward, Lori Welte. A multiple stress, multiple component stress screening cost model. masters thesis, Virginia Tech, 1985. http://hdl.handle.net/10919/41578