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Virginia Tech

Sample introduction and solvent effects in an argon and helium microwave induced plasma

Abstract

dc:description.abstract

Atomic emission spectrometry (AES) with a plasma has proven to be an important method for the analysis of metallic and nonmetallic species in a variety of matrices. Not only is atomic spectrometry useful for accurate and sensitive quantitative analysis, but it can be used as a means of unambiguous qualitative determinations. The most common matrix for AES samples is liquid. Whether aqueous or organic in nature, the majority of samples are dissolved in some sort of solvent. Unfortunately, for most modes of sample introduction, a large portion of the solvent is simultaneously introduced to the plasma discharge along with the analyte species. The plasma is thus required not only to sufficiently excite the analyte, but also to desolvate and vaporize the solvent species. These processes tend to diminish the available energy of the plasma that is to be directed toward the analyte. The nature of the energy loss due to solvent loading is not well understood and is the topic of debate for different systems. It is the focus of this dissertation to determine the effect of solvent loading on the Highly Efficient Microwave Induced Plasma (HEMIP). The magnitude of solvent loading for Ar and He discharges using different sample introduction systems is determined. The solvent load is shown to have two separate constituents: aerosol and vapor. Each of these are shown to affect the plasma in different ways. Two different sample introduction systems are evaluated for their respective solvent loadings: a cooled pneumatic nebulizer / double pass spray chamber and an ultrasonic nebulization system. These systems are compared under their normal operating conditions and for the two plasma support gases. High solvent loads are shown to destabilize both the Ar and He microwave plasmas, decrease analytical sensitivity, and attenuate the energy of the plasma discharge. The conditions under which solvent loading is minimized do not have a significant effect on the operational characteristics of the sample introduction systems, but provide the optimal analytical sensitivity and limits of detection for the HEMIP.

Degree

thesis:*
Name thesis:degree_name
Ph. D.
Level thesis:degree_level
doctoral
Discipline thesis:degree_discipline
Chemistry
Department dc:contributor.department
Chemistry
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
1992

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • McCleary, Keith Alan
Chair dc:contributor.committeechair
  • Long, Gary L.
Committee members dc:contributor.committeemember
  • Anderson, Mark R.
  • Schick, G. Alan
  • Merola, Joseph S.
  • Sanzone, George

Rights

dc:rights
Statement dc:rights
  • In Copyright
Language dc:language.iso
en

Identifiers

dc:identifier.*
Dc Identifier Other
etd-12222005-090629
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/40444

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
related terms
citation

McCleary, Keith Alan. Sample introduction and solvent effects in an argon and helium microwave induced plasma. doctoral thesis, Virginia Tech, 1992. http://hdl.handle.net/10919/40444