Optimal stress screening for products sold under warranty

In the face of increasing awareness among customers and today's competitive market, the warranty of a product has become an added feature in marketing strategy. A reliable product causes less warranty support cost. However, a more reliable product costs more to manufacture. Thus, a suitable trade-off between the cost and the benefit of a development and testing program is essential to optimize the performance measure, e. g., minimize total expected cost. Renewal theoretic models of sequences of failures over the burn-in and warranty periods and their costs are developed. Contrary to the usual asymptotic assumptions, transient behaviors of the renewal processes are considered. The expected costs associated with in-plant and field failures are balanced against the costs of implementing a burn-in program. A multi-component series system with different Weibull distributions for the components are considered. Burn-in is performed at the assembly level and the components are assumed to have different age accelerations under a common stress regimen. Models based on analyses both at the component and the system level are constructed. Two different burn-in policies are considered. These are "fixed duration" bum-in and "failure freell burn-in. A free replacement warranty for the components with policies of both fixed warranty period and renewed warranty period after each failure is considered in the models. The profit functions under different models are optimized with respect to burn-in period, stress parameters and warranty period. The models are extended to include reliability growth over the warranty period. Finally I solution procedures for optimizing the profit functions for all cases are given.

Name thesis:degree_name

Ph. D.

Level thesis:degree_level

doctoral

Discipline thesis:degree_discipline

Industrial and Systems Engineering

Department dc:contributor.department

Industrial and Systems Engineering

Grantor dc:publisher

Virginia Tech

Year dc:date.issued

1993

Author dc:creator

• Kar, Tapas Ranjan

Chair dc:contributor.committeechair

• Nachlas, Joel A.

Committee members dc:contributor.committeemember

• Sherali, Hanif D.
• Reynolds, Marion R. Jr.
• Topuz, Ertugrul

Statement dc:rights

• In Copyright

Licence dc:rights.uri

• http://rightsstatements.org/vocab/InC/1.0/

Language dc:language.iso

en

Dc Identifier Other

etd-10212005-123009

OAI identifier oai:identifier

oai:vtechworks.lib.vt.edu:10919/40070