Abstract
dc:description.abstractA novel in-situ stress measurement technique to study the formation kinetics of multi component oxide thin films was developed and was applied to PbTiO₃. Single phase PbTi 0₃ thin films were formed from the reaction between films in the deposited PbO ITi0₂ multilayer. The film stoichiometry was accurately controlled by depositing individual layers of the required thickness. Development of film stresses associated with the formation of the product layer at the PbO/Ti0₂ interface of the multilayers was used to monitor growth rate of the PbTiO₃ layer. It was found that growth of the PbTiO₃ phase obeyed the parabolic law and the effective activation energy was estimated to be 108 kJ/mole. It is believed that the mechanism of this reaction was dominated by grain boundary diffusion of the participating cations.
Degree
thesis:*- Name thesis:degree_name
- Ph. D.
- Level thesis:degree_level
- doctoral
- Discipline thesis:degree_discipline
- Materials Engineering Science
- Department dc:contributor.department
- Materials Engineering Science
- Grantor dc:publisher
- Virginia Tech
- Year dc:date.issued
- 1994
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Li, Chen-Chung
- Chair dc:contributor.committeechair
-
- Desu, Seshu B.
- Committee members dc:contributor.committeemember
-
- Dillard, John G.
- Hendricks, Robert W.
- Cox, David
- Reynolds, William T. Jr.
Rights
dc:rights- Statement dc:rights
-
- In Copyright
- Licence dc:rights.uri
- Language dc:language.iso
- en
Identifiers
dc:identifier.*- Dc Identifier Other
- etd-10202005-102831
- OAI identifier oai:identifier
- oai:vtechworks.lib.vt.edu:10919/40039