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Virginia Tech

Wideband characterization of aluminum nitride substrates and high power-high frequency thick film applications

Abstract

dc:description.abstract

Ceramic substrates play an important role in thick film hybrid microelectronic circuits. Existing substrates such as alumina and beryllia do not meet satisfactorily the desired requirements. The newly developed aluminum nitride (<i>AIN</i>) substrate shows a great deal of promise and potentially embraces the best qualities of alumina and beryllia. The objective of this dissertation is to study the electrical properties, thick film interaction, and environmental effects on <i>AIN</i> substrates, and also to examine the performance of this material for high power - high frequency hybrid thick film applications. In particular, wideband dielectric constant measurements of A1N and other ceramic substrates are performed, oxidization and humidity effects on surface properties of <i>AIN</i> are addressed, and short and long term aging effects on several circuit parameters are studied. To evaluate the performance of <i>AIN</i> in high power and high frequency applications, two circuits; an impulse generator and a power converter, are realized, tested and compared with those on alumina substrates. The thick film circuits realized on <i>AIN</i> perform considerably better than those on alumina.

Degree

thesis:*
Name thesis:degree_name
Ph. D.
Level thesis:degree_level
doctoral
Discipline thesis:degree_discipline
Electrical Engineering
Department dc:contributor.department
Electrical Engineering
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
1992

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Farzanehfard, Hosein
Chair dc:contributor.committeechair
  • Elshabini-Riad, Aicha A.
Committee members dc:contributor.committeemember
  • Johnson, Lee W.
  • Rahman, Saifur
  • Riad, Sedki Mohamed
  • Safaai-Jazi, Ahmad

Rights

dc:rights
Statement dc:rights
  • In Copyright
Language dc:language.iso
en

Identifiers

dc:identifier.*
Dc Identifier Other
etd-10122005-134447
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/39788

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
related terms
citation

Farzanehfard, Hosein. Wideband characterization of aluminum nitride substrates and high power-high frequency thick film applications. doctoral thesis, Virginia Tech, 1992. http://hdl.handle.net/10919/39788