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Virginia Tech

A response surface approach to data analysis in robust parameter design

Abstract

dc:description.abstract

It has become obvious that combined arrays and a response surface approach can be effective tools in our quest to reduce (process) variability. An important aspect of the improvement of quality is to suppress the magnitude of the influence coming from subtle changes of noise factors. To model and control process variability induced by noise factors we take a response surface approach. The derivative of the standard response function with respect to noise factors, i. e., the slopes of the response function in the direction of the noise factors, play an important role in the study of the minimum process variance. For better understanding of the process variability, we study various properties of both biased and the unbiased estimators of the process variance. Response surface modeling techniques and the ideas involved with variance modeling and estimation through the function of the aforementioned derivatives is a valuable concept in this study. In what follows, we describe the use of the response surface methodology for situations in which noise factors are used. The approach is to combine Taguchi's notion of heterogeneous variability with standard design and modeling techniques available in response surface methodology.

Degree

thesis:*
Name thesis:degree_name
Ph. D.
Level thesis:degree_level
doctoral
Discipline thesis:degree_discipline
Statistics
Department dc:contributor.department
Statistics
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
1992

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Kim, Yoon G.
Chair dc:contributor.committeechair
  • Myers, Raymond H.
Committee members dc:contributor.committeemember
  • Hinkelmann, Klaus H.
  • Holtzman, Golde I.
  • Krutchkoff, Richard G.
  • Pirie, Walter R.

Rights

dc:rights
Statement dc:rights
  • In Copyright
Language dc:language.iso
en

Identifiers

dc:identifier.*
Dc Identifier Other
etd-06192006-125721
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/38627

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
related terms
citation

Kim, Yoon G.. A response surface approach to data analysis in robust parameter design. doctoral thesis, Virginia Tech, 1992. http://hdl.handle.net/10919/38627