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Virginia Tech

Moiré interferometry at high temperatures

Abstract

dc:description.abstract

The objective of this study was to provide an optical technique allowing full-field in-plane deformation measurements at high temperature by using high-sensitivity moiré interferometry. This was achieved by a new approach of performing deformation measurements at high temperatures in a vacuum oven using an achromatic interferometer. The moiré system setup was designed with particular consideration for the stability, compactness, flexibility, and ease of control. A vacuum testing environment was provided to minimize the instability of the patterns by protecting the optical instruments from the thermal convection currents. Also, a preparation procedure for the high-temperature specimen grating was developed with the use of the plasma-etched technique. Gold was used as a metallic layer in this procedure. This method was demonstrated on a ceramic block, metal/matrix composite, and quartz. Thermal deformation of a quartz specimen was successfully measured in vacuum at 980 degrees Celsius, with the sensitivity of 417 nm per fringe. The stable and well-defined interference patterns confirmed the feasibility of the developments, including the high-temperature moiré system and high-temperature specimen grating. The moiré system was demonstrated to be vibration-insensitive. Also, the contrast of interference fringes at high temperature was enhanced by means of a spatial filter and a narrow band interference filter to minimize the background noise from the glow of the specimen and heater. The system was verified by a free thermal expansion test of an aluminum block. Good agreement demonstrated the validity of the optical design. The measurements of thermal deformation mismatch were performed on a graphite/epoxy composite, a metal/matrix composite equipped with an optical fiber, and a cutting tool bit. A high-resolution data-reduction technique was used to measure the Strain distribution of the cutting tool bit.

Degree

thesis:*
Name thesis:degree_name
Ph. D.
Level thesis:degree_level
doctoral
Discipline thesis:degree_discipline
Engineering Mechanics
Department dc:contributor.department
Engineering Mechanics
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
1992

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Wu, Jau-Je
Chair dc:contributor.committeechair
  • Czarnek, Robert
Committee members dc:contributor.committeemember
  • Smith, Charles W.
  • Morton, John
  • Plaut, Raymond H.
  • Claus, Richard O.

Rights

dc:rights
Statement dc:rights
  • In Copyright
Language dc:language.iso
en

Identifiers

dc:identifier.*
Dc Identifier Other
etd-05042006-164510
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/37687

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-24
Source record
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related terms
citation

Wu, Jau-Je. Moiré interferometry at high temperatures. doctoral thesis, Virginia Tech, 1992. http://hdl.handle.net/10919/37687