Diffraction by Building Corners at 28 Ghz: Measurements and Modeling

This thesis presents the results of a 28 GHz continuous-wave (CW) diffraction measurement campaign in the Washington, DC area. It describes the measurement approach including information on equipment and testing methods. Also described are the various parameters that affected the diffraction loss. Observed diffraction losses showed little dependence on polarization and building material. For diffraction angles greater than 5 degrees, a simple linear equation was fit to the data and accurately describes the diffraction loss. A logarithmic equation describes the dependence at smaller angles. The model developed shows very good agreement with theory and other measurements. Also included are an overview of the fixed wireless industry, a discussion of system design issues, and a review of the historical and mathematical development of diffraction theory.

Name thesis:degree_name

Master of Science

Level thesis:degree_level

masters

Discipline thesis:degree_discipline

Electrical Engineering

Department dc:contributor.department

Electrical Engineering

Grantor dc:publisher

Virginia Tech

Year dc:date.issued

1998

Author dc:creator

• Tenerelli, Peter A. Jr.

Chair dc:contributor.committeechair

• Bostian, Charles W.

Committee members dc:contributor.committeemember

• Jacobs, Ira
• Stutzman, Warren L.
• Stivers, Camilla
• Harmon, Michael M.
• Yoon, Roe-Hoan

• diffraction
• propagation
• LMDS
• 28 GHz
• measurements

Statement dc:rights

• In Copyright

Licence dc:rights.uri

• http://rightsstatements.org/vocab/InC/1.0/

Dc Identifier Other

etd-71098-185056

OAI identifier oai:identifier

oai:vtechworks.lib.vt.edu:10919/36891