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Virginia Tech

Predicting Package Defects: Quantification of Critical Leak Size

Abstract

dc:description.abstract

Threshold leak sizes and leak rates were calculated for a number of liquid food products exhibiting a wide range of surface tension and viscosity values. From this data, one can see that mathematically, under typical pressure differentials generated in food packages (less than or equal to ±34.5 kPa), a leak will never start through a 2 μm defect. The calculated leak rates were compared to calculated evaporation rates. The evaporation rate exceeds the leak rate at lower sized microholes (2, and 5 μm diameter) under typical pressure differentials found in food packages. If the liquid, typically aqueous in food products, is evaporating off faster than the leak itself, then there will be solids left behind that could effectively plug the leak. The critical leak size is the size micro-defect that allows microbial penetration into the package. The critical leak size of air-filled defects was found to be 7 μm at all pressures tested. This size is considerably important to food packagers because this is when sterility of the package is lost. Previous leak studies have shown that the critical leak size for liquid-filled defects coincide with the threshold leak size and pressure. If this is in fact true, then air-filled defects should exhibit a larger critical leak size than the liquid-filled defects. In this study, air-filled defects were examined. A bioaerosol exposure chamber was used to test micro-defects, nickel microtubes of known diameters 2, 5, 7, 10, 20, and 50 μm hydraulic diameters, against pressure differentials of 0, -6.9, -13.8, and -34.5 kPa.

Degree

thesis:*
Name thesis:degree_name
Master of Science
Level thesis:degree_level
masters
Discipline thesis:degree_discipline
Food Science and Technology
Department dc:contributor.department
Food Science and Technology
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
2000

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Gibney, Matthew Joseph IV
Chair dc:contributor.committeechair
  • Marcy, Joseph E.
Committee members dc:contributor.committeemember
  • Hackney, Cameron Raj
  • Blakistone, Barbara A.
  • Davis, Richey M.

Subjects

dc:subject × 5

Rights

dc:rights
Statement dc:rights
  • In Copyright

Identifiers

dc:identifier.*
Dc Identifier Other
etd-08312000-14550031
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/34857

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Gibney, Matthew Joseph IV. Predicting Package Defects: Quantification of Critical Leak Size. masters thesis, Virginia Tech, 2000. http://hdl.handle.net/10919/34857