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Virginia Tech

Towards A Sufficient Set of Mutation Operators for Structured Query Language (SQL)

Abstract

dc:description.abstract

Test suites for database applications depend on adequate test data and real-world test faults for success. An automated tool is available that quantifies test data coverage for database queries written in SQL. An automated tool is also available that mimics real-world faults by mutating SQL, however tests have revealed that these simulated faults do not completely represent real-world faults. This paper demonstrates how half of the mutation operators used by the SQL mutation tool in real-world test suites generated significantly lower detection scores than those from research test suites. Three revised mutation operators are introduced that improve detection scores and contribute toward re-defining a sufficient set of mutation operators for SQL. Finally, a procedure is presented that reduces the test burden by automatically comparing SQL mutants with their original queries.

Degree

thesis:*
Name thesis:degree_name
Master of Science
Level thesis:degree_level
masters
Discipline thesis:degree_discipline
Computer Science
Department dc:contributor.department
Computer Science
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
2010

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • McCormick II, Donald W.
Chair dc:contributor.committeechair
  • Frakes, William B.
Committee members dc:contributor.committeemember
  • Kulczycki, Gregory W.
  • Lu, Chang-Tien

Subjects

dc:subject × 4

Rights

dc:rights
Statement dc:rights
  • In Copyright

Identifiers

dc:identifier.*
Dc Identifier Other
etd-05102010-182118
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/32526

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

McCormick II, Donald W.. Towards A Sufficient Set of Mutation Operators for Structured Query Language (SQL). masters thesis, Virginia Tech, 2010. http://hdl.handle.net/10919/32526