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Virginia Tech

Characterization of Organic and Inorganic Optoelectronic Semiconductor Devices Using Advanced Spectroscopic Methods

Abstract

dc:description.abstract

In this thesis, advanced spectroscopy methods are discussed and applied to gain understanding of the physical properties of organic conjugated molecules, II-VI thin film semiconductors, and vertical cavity surface emitting lasers (VCSEL). Experiments include single photon and two-photon excitation with lasers, with subsequent measurements of the absorption and photoluminescence, as well as photocurrent measurements using tungsten and xenon lamps, measuring the direct current and the alternating current of the devices. The materials are investigated in dissolved form (conjugated polymers), thin films (polymers, II-VI semiconductors), and complex layer structures (hybrid device, VCSEL). The experiments are analyzed and interpreted by newly developed or applied theories for two-photon saturation processes in semiconductors, bandgap shrinkage due to optically induced electron hole pairs, and the principle of detailed balance to describe the photoluminescence in thin film cadmium sulfide.

Degree

thesis:*
Name thesis:degree_name
Ph. D.
Level thesis:degree_level
doctoral
Discipline thesis:degree_discipline
Physics
Department dc:contributor.department
Physics
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
2001

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Schroeder, Raoul
Chairs dc:contributor.committeechair
  • Ullrich, Bruno R.
  • Heflin, James R.
Committee members dc:contributor.committeemember
  • Graupner, Wilhelm
  • Indebetouw, Guy J.
  • Davis, Richey M.
  • Ficenec, John R.

Subjects

dc:subject × 6

Rights

dc:rights
Statement dc:rights
  • In Copyright

Identifiers

dc:identifier.*
Dc Identifier Other
etd-01072002-094801
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/25957

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Schroeder, Raoul. Characterization of Organic and Inorganic Optoelectronic Semiconductor Devices Using Advanced Spectroscopic Methods. doctoral thesis, Virginia Tech, 2001. http://hdl.handle.net/10919/25957