{"id":{"repo_id":"vt","oai_identifier":"oai:vtechworks.lib.vt.edu:10919/23221"},"canonical_url":"https://search.dev.ndltd.org/etd/vt/oai:vtechworks.lib.vt.edu:10919/23221","repository":{"repo_id":"vt","name":"Virginia Tech","base_url":"https://vtechworks.lib.vt.edu/oai/request"},"display":{"title":"New Approach to finding Active Element Patterns for Large Arrays","abstract":"In this study a new approach to active-element pattern analysis, for large phased array antennas, was created using Floquet's theorem. The classic approach to finding active-element patterns uses a full array simulation that can become slow and produce patterns that are specific to certain elements in the array, though basically identical away from the array edge. Instead of producing specific active-element patterns an average active-element pattern could be created and then applied that to the array. The average active-element pattern can be used for every element in the array with a small margin of error. Using Floquet's theorem reduces any differences between elements in the array and gives the most accurate active-element pattern within a reasonable time constraint. Floquet average active-element patterns are computed by using an infinite array and a summation is done for the far-field radiation values of a finite array based on the number of elements using typical pattern multiplication techniques. Therefore, accuracy of the Floquet element approach is excellent for arrays on the size of hundreds to thousands of elements. An active-element pattern is determined by scanning the array and taking the far-field radiation value at each beam scan-angle. Each beam scan-angle value is a summation of the element radiation patterns in that specific direction. These beam scan-angle values are then reduced by the number of elements in the array to form a radiation pattern. This radiation pattern is the average active-element pattern.","abstract_html":"In this study a new approach to active-element pattern analysis, for large phased array antennas, was created using Floquet's theorem. The classic approach to finding active-element patterns uses a full array simulation that can become slow and produce patterns that are specific to certain elements in the array, though basically identical away from the array edge. Instead of producing specific active-element patterns an average active-element pattern could be created and then applied that to the array. The average active-element pattern can be used for every element in the array with a small margin of error. Using Floquet's theorem reduces any differences between elements in the array and gives the most accurate active-element pattern within a reasonable time constraint. Floquet average active-element patterns are computed by using an infinite array and a summation is done for the far-field radiation values of a finite array based on the number of elements using typical pattern multiplication techniques. Therefore, accuracy of the Floquet element approach is excellent for arrays on the size of hundreds to thousands of elements. An active-element pattern is determined by scanning the array and taking the far-field radiation value at each beam scan-angle. Each beam scan-angle value is a summation of the element radiation patterns in that specific direction. These beam scan-angle values are then reduced by the number of elements in the array to form a radiation pattern. This radiation pattern is the average active-element pattern.","abstract_has_math":false,"creators":["O'Donnell, Alan Larkin"],"institution":"Virginia Tech","degree_name":"Master of Science","degree_level":"masters","degree_discipline":"Electrical Engineering","degree_department":"Electrical and Computer Engineering","school":null,"contributors":[],"advisors":[],"committee_chairs":["Davis, William A."],"committee_members":["Stutzman, Warren L.","Manteghi, Majid"],"year":2013,"date_issued":"2013-06-13","date_published":"2013-06-13","updated_at":"2026-07-22T22:20:34Z","subjects":["Acive-element patterns","large arrays","Floquet"],"languages":[],"rights":["In Copyright"],"rights_urls":["http://rightsstatements.org/vocab/InC/1.0/"],"identifier_entries":[{"key":"dc:identifier.other","label":"Dc Identifier Other","values":["vt_gsexam:907"],"render_values":[{"text":"vt_gsexam:907","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/10919/23221","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.committeechair","label":"Committee Chair","values":["Davis, William A."]},{"key":"dc:contributor.committeemember","label":"Committee Member","values":["Stutzman, Warren L.","Manteghi, Majid"]},{"key":"dc:contributor.department","label":"Department","values":["Electrical and Computer Engineering"]},{"key":"dc:creator","label":"Author","values":["O'Donnell, Alan Larkin"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2013-06-14T08:00:13Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2013-06-14T08:00:13Z"]},{"key":"dc:date.issued","label":"Date","values":["2013-06-13"]},{"key":"dc:publisher","label":"Institution","values":["Virginia Tech"]},{"key":"dc:type","label":"Dc Type","values":["Thesis"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["masters"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Master of Science"]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["Virginia Polytechnic Institute and State University"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Acive-element patterns","large arrays","Floquet"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:rights","label":"Dc Rights","values":["In Copyright"]},{"key":"dc:rights.uri","label":"Rights URI","values":["http://rightsstatements.org/vocab/InC/1.0/"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.other","label":"Dc Identifier Other","values":["vt_gsexam:907"]},{"key":"dc:identifier.uri","label":"Identifier URI","values":["http://hdl.handle.net/10919/23221"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["In this study a new approach to active-element pattern analysis, for large phased array antennas, was created using Floquet's theorem. The classic approach to finding active-element patterns uses a full array simulation that can become slow and produce patterns that are specific to certain elements in the array, though basically identical away from the array edge. Instead of producing specific active-element patterns an average active-element pattern could be created and then applied that to the array. The average active-element pattern can be used for every element in the array with a small margin of error. Using Floquet's theorem reduces any differences between elements in the array and gives the most accurate active-element pattern within a reasonable time constraint. Floquet average active-element patterns are computed by using an infinite array and a summation is done for the far-field radiation values of a finite array based on the number of elements using typical pattern multiplication techniques. Therefore, accuracy of the Floquet element approach is excellent for arrays on the size of hundreds to thousands of elements. An active-element pattern is determined by scanning the array and taking the far-field radiation value at each beam scan-angle. Each beam scan-angle value is a summation of the element radiation patterns in that specific direction. These beam scan-angle values are then reduced by the number of elements in the array to form a radiation pattern. This radiation pattern is the average active-element pattern."]},{"key":"dc:description.degree","label":"Dc Description Degree","values":["Master of Science"]},{"key":"dc:format.medium","label":"Dc Format Medium","values":["ETD"]},{"key":"dc:title","label":"Title","values":["New Approach to finding Active Element Patterns for Large Arrays"]}]}],"canonical_facts":{"dc:contributor.committeechair":["Davis, William A."],"dc:contributor.committeemember":["Stutzman, Warren L.","Manteghi, Majid"],"dc:contributor.department":["Electrical and Computer Engineering"],"dc:creator":["O'Donnell, Alan Larkin"],"dc:date.accessioned":["2013-06-14T08:00:13Z"],"dc:date.available":["2013-06-14T08:00:13Z"],"dc:date.issued":["2013-06-13"],"dc:description.abstract":["In this study a new approach to active-element pattern analysis, for large phased array antennas, was created using Floquet's theorem. The classic approach to finding active-element patterns uses a full array simulation that can become slow and produce patterns that are specific to certain elements in the array, though basically identical away from the array edge. Instead of producing specific active-element patterns an average active-element pattern could be created and then applied that to the array. The average active-element pattern can be used for every element in the array with a small margin of error. Using Floquet's theorem reduces any differences between elements in the array and gives the most accurate active-element pattern within a reasonable time constraint. Floquet average active-element patterns are computed by using an infinite array and a summation is done for the far-field radiation values of a finite array based on the number of elements using typical pattern multiplication techniques. Therefore, accuracy of the Floquet element approach is excellent for arrays on the size of hundreds to thousands of elements. An active-element pattern is determined by scanning the array and taking the far-field radiation value at each beam scan-angle. Each beam scan-angle value is a summation of the element radiation patterns in that specific direction. These beam scan-angle values are then reduced by the number of elements in the array to form a radiation pattern. This radiation pattern is the average active-element pattern."],"dc:description.degree":["Master of Science"],"dc:format.medium":["ETD"],"dc:identifier.other":["vt_gsexam:907"],"dc:identifier.uri":["http://hdl.handle.net/10919/23221"],"dc:publisher":["Virginia Tech"],"dc:rights":["In Copyright"],"dc:rights.uri":["http://rightsstatements.org/vocab/InC/1.0/"],"dc:subject":["Acive-element patterns","large arrays","Floquet"],"dc:title":["New Approach to finding Active Element Patterns for Large Arrays"],"dc:type":["Thesis"],"thesis:degree_discipline":["Electrical Engineering"],"thesis:degree_level":["masters"],"thesis:degree_name":["Master of Science"],"thesis:institution_name":["Virginia Polytechnic Institute and State University"]},"updated_at":"2026-07-22T22:20:34Z"}