{"id":{"repo_id":"vt","oai_identifier":"oai:vtechworks.lib.vt.edu:10919/138136"},"canonical_url":"https://search.dev.ndltd.org/etd/vt/oai:vtechworks.lib.vt.edu:10919/138136","repository":{"repo_id":"vt","name":"Virginia Tech","base_url":"https://vtechworks.lib.vt.edu/oai/request"},"display":{"title":"Dynamic Characterization of Wide Bandgap Devices for Power Electronic System Integration","abstract":"Wide Bandgap (WBG) devices offer significant performance advantages for next-generation power electronic systems. However, the dynamic stresses induced by application-specific conditions present limited physical and behavioral understanding, posing critical concerns for reliability and performance degradation. Therefore, this dissertation presents novel characterization methods, measurement techniques, and analytical frameworks to investigate dynamic switching stresses in WBG devices and the integration strategies to optimize power electronic system performance. The key state-of-the-art challenges and research gaps are identified related to dynamic stress effects throughout the system integration process of the WBG devices. An application-oriented converter stress characterization methodology is developed to evaluate the impact of dynamic operating stresses. Advanced measurement circuits and stress-induced performance evaluation techniques are designed to enable a deeper understanding of device behavior and facilitate maintenance or screening procedures. Lastly, multi-objective design optimization and lifetime performance evaluation of system-level WBG device integration are applied to demonstrate how dynamic stress insights can be leveraged to optimize overall system performance and develop novel operational lifetime prediction methodologies. This dissertation provides both a framework with a methodological and practical foundation for integrating WBG devices into high-performance, application-oriented power electronic systems by addressing key industry and research needs for improved characterization, measurement, reliability, and lifetime modeling.","abstract_html":"Wide Bandgap (WBG) devices offer significant performance advantages for next-generation power electronic systems. However, the dynamic stresses induced by application-specific conditions present limited physical and behavioral understanding, posing critical concerns for reliability and performance degradation. Therefore, this dissertation presents novel characterization methods, measurement techniques, and analytical frameworks to investigate dynamic switching stresses in WBG devices and the integration strategies to optimize power electronic system performance. The key state-of-the-art challenges and research gaps are identified related to dynamic stress effects throughout the system integration process of the WBG devices. An application-oriented converter stress characterization methodology is developed to evaluate the impact of dynamic operating stresses. Advanced measurement circuits and stress-induced performance evaluation techniques are designed to enable a deeper understanding of device behavior and facilitate maintenance or screening procedures. Lastly, multi-objective design optimization and lifetime performance evaluation of system-level WBG device integration are applied to demonstrate how dynamic stress insights can be leveraged to optimize overall system performance and develop novel operational lifetime prediction methodologies. This dissertation provides both a framework with a methodological and practical foundation for integrating WBG devices into high-performance, application-oriented power electronic systems by addressing key industry and research needs for improved characterization, measurement, reliability, and lifetime modeling.","abstract_has_math":false,"creators":["Gill, Lee"],"institution":"Virginia Tech","degree_name":"Doctor of Philosophy","degree_level":"doctoral","degree_discipline":"Electrical Engineering","degree_department":"Electrical Engineering","school":null,"contributors":[],"advisors":[],"committee_chairs":["Michaels, Alan J."],"committee_members":["Centeno, Virgilio A.","Dimarino, Christina Marie","Scales, Wayne A.","Southward, Steve C."],"year":2025,"date_issued":"2025-10-10","date_published":"2025-10-10","updated_at":"2026-07-22T22:20:18Z","subjects":["wide bandgap","dynamic characterization","optimal system integration","reliability"],"languages":["en"],"rights":["In Copyright"],"rights_urls":["http://rightsstatements.org/vocab/InC/1.0/"],"identifier_entries":[{"key":"dc:identifier.other","label":"Dc Identifier Other","values":["vt_gsexam:44642"],"render_values":[{"text":"vt_gsexam:44642","href":null,"code":true}]}]},"links":{"outbound_url":"https://hdl.handle.net/10919/138136","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.committeechair","label":"Committee Chair","values":["Michaels, Alan J."]},{"key":"dc:contributor.committeemember","label":"Committee Member","values":["Centeno, Virgilio A.","Dimarino, Christina Marie","Scales, Wayne A.","Southward, Steve C."]},{"key":"dc:contributor.department","label":"Department","values":["Electrical Engineering"]},{"key":"dc:creator","label":"Author","values":["Gill, Lee"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2025-10-11T08:00:17Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2025-10-11T08:00:17Z"]},{"key":"dc:date.issued","label":"Date","values":["2025-10-10"]},{"key":"dc:publisher","label":"Institution","values":["Virginia Tech"]},{"key":"dc:type","label":"Dc Type","values":["Dissertation"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["doctoral"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Doctor of Philosophy"]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["Virginia Polytechnic Institute and State University"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["wide bandgap","dynamic characterization","optimal system integration","reliability"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language.iso","label":"Language (ISO)","values":["en"]},{"key":"dc:rights","label":"Dc Rights","values":["In Copyright"]},{"key":"dc:rights.uri","label":"Rights URI","values":["http://rightsstatements.org/vocab/InC/1.0/"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.other","label":"Dc Identifier Other","values":["vt_gsexam:44642"]},{"key":"dc:identifier.uri","label":"Identifier URI","values":["https://hdl.handle.net/10919/138136"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["Wide Bandgap (WBG) devices offer significant performance advantages for next-generation power electronic systems. However, the dynamic stresses induced by application-specific conditions present limited physical and behavioral understanding, posing critical concerns for reliability and performance degradation. Therefore, this dissertation presents novel characterization methods, measurement techniques, and analytical frameworks to investigate dynamic switching stresses in WBG devices and the integration strategies to optimize power electronic system performance. The key state-of-the-art challenges and research gaps are identified related to dynamic stress effects throughout the system integration process of the WBG devices. An application-oriented converter stress characterization methodology is developed to evaluate the impact of dynamic operating stresses. Advanced measurement circuits and stress-induced performance evaluation techniques are designed to enable a deeper understanding of device behavior and facilitate maintenance or screening procedures. Lastly, multi-objective design optimization and lifetime performance evaluation of system-level WBG device integration are applied to demonstrate how dynamic stress insights can be leveraged to optimize overall system performance and develop novel operational lifetime prediction methodologies. This dissertation provides both a framework with a methodological and practical foundation for integrating WBG devices into high-performance, application-oriented power electronic systems by addressing key industry and research needs for improved characterization, measurement, reliability, and lifetime modeling."]},{"key":"dc:description.abstractgeneral","label":"General Abstract","values":["Wide Bandgap (WBG) technologies can improve the performance of transportation electrification, energy storage systems, and grid-connected power systems by making them more efficient, robust, and reliable. However, when these devices are integrated into real-world applications, they face unique challenges; constantly changing operating conditions can strain their performance and shorten their lifetime. Also, traditional performance evaluation methods cannot fully capture the dynamics of WBG device integration challenges. This dissertation discusses developing new strategies to better understand how these advanced devices behave and how their integration is affected under practical operating conditions. It combines advanced measurement techniques, new ways to test and monitor device reliability, and methods to optimize the design process for these devices when deployed in real systems. By holistically investigating how dynamic stresses impact performance and reliability, this work helps engineers, designers, and manufacturers build better power electronic systems that fully extend the benefits of WBG technologies. Lastly, this research bridges the gap between what WBG devices are capable of in theory and how they perform in real-world applications, supporting more reliable and better integrated system as a whole."]},{"key":"dc:description.degree","label":"Dc Description Degree","values":["Doctor of Philosophy"]},{"key":"dc:format.medium","label":"Dc Format Medium","values":["ETD"]},{"key":"dc:title","label":"Title","values":["Dynamic Characterization of Wide Bandgap Devices for Power Electronic System Integration"]}]}],"canonical_facts":{"dc:contributor.committeechair":["Michaels, Alan J."],"dc:contributor.committeemember":["Centeno, Virgilio A.","Dimarino, Christina Marie","Scales, Wayne A.","Southward, Steve C."],"dc:contributor.department":["Electrical Engineering"],"dc:creator":["Gill, Lee"],"dc:date.accessioned":["2025-10-11T08:00:17Z"],"dc:date.available":["2025-10-11T08:00:17Z"],"dc:date.issued":["2025-10-10"],"dc:description.abstract":["Wide Bandgap (WBG) devices offer significant performance advantages for next-generation power electronic systems. 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However, when these devices are integrated into real-world applications, they face unique challenges; constantly changing operating conditions can strain their performance and shorten their lifetime. Also, traditional performance evaluation methods cannot fully capture the dynamics of WBG device integration challenges. This dissertation discusses developing new strategies to better understand how these advanced devices behave and how their integration is affected under practical operating conditions. It combines advanced measurement techniques, new ways to test and monitor device reliability, and methods to optimize the design process for these devices when deployed in real systems. By holistically investigating how dynamic stresses impact performance and reliability, this work helps engineers, designers, and manufacturers build better power electronic systems that fully extend the benefits of WBG technologies. Lastly, this research bridges the gap between what WBG devices are capable of in theory and how they perform in real-world applications, supporting more reliable and better integrated system as a whole."],"dc:description.degree":["Doctor of Philosophy"],"dc:format.medium":["ETD"],"dc:identifier.other":["vt_gsexam:44642"],"dc:identifier.uri":["https://hdl.handle.net/10919/138136"],"dc:language.iso":["en"],"dc:publisher":["Virginia Tech"],"dc:rights":["In Copyright"],"dc:rights.uri":["http://rightsstatements.org/vocab/InC/1.0/"],"dc:subject":["wide bandgap","dynamic characterization","optimal system integration","reliability"],"dc:title":["Dynamic Characterization of Wide Bandgap Devices for Power Electronic System Integration"],"dc:type":["Dissertation"],"thesis:degree_discipline":["Electrical Engineering"],"thesis:degree_level":["doctoral"],"thesis:degree_name":["Doctor of Philosophy"],"thesis:institution_name":["Virginia Polytechnic Institute and State University"]},"updated_at":"2026-07-22T22:20:18Z"}