Time-to-Event Modeling with Bayesian Perspectives and Applications in Reliability of Artificial Intelligence Systems

With the fast development of artificial intelligence (AI) technology, the reliability of AI needs to be investigated for confidently using AI products in our daily lives. This dissertation includes three projects introducing the statistical models and model estimation methods that can be used in the reliability analysis of AI systems. The first project analyzes the recurrent events data from autonomous vehicles (AVs). A nonparametric model is proposed to study the reliability of AI systems in AVs, and a statistical framework is introduced to evaluate the adequacy of using traditional parametric models in the analysis. The proposed model and framework are then applied to analyze AV data from four manufacturers that participated in an AV driving testing program overseen by the California Department of Motor Vehicles. The second project develops a survival model to investigate the failure times of graphics processing units (GPUs) used in supercomputers. The model considers several covariates, the spatial correlation, and the correlation among multiple types of failures. In addition, unique spatial correlation functions and a special distance function are introduced to quantify the spatial correlation inside supercomputers. The model is applied to explore the GPU failure times in the Titan supercomputer. The third project proposes a new Markov chain Monte Carlo sampler that can be used in the estimation and inference of spatial survival models. The sampler can generate a reasonable amount of samples within a shorter computing time compared with existing popular samplers. Important factors that can influence the performance of the proposed sampler are explored, and the sampler is used to analyze the Titan GPU failures to illustrate its usefulness in solving real-world problems.

Name thesis:degree_name

Doctor of Philosophy

Level thesis:degree_level

doctoral

Discipline thesis:degree_discipline

Statistics

Department dc:contributor.department

Statistics

Grantor dc:publisher

Virginia Tech

Year dc:date.issued

2024

Author dc:creator

• Min, Jie

Chair dc:contributor.committeechair

• Hong, Yili

Committee members dc:contributor.committeemember

• Franck, Christopher Thomas
• Kim, Inyoung
• Datta, Jyotishka

• Bayesian Model
• Markov Chain Monte Carlo
• NUTS
• Recurrent Events
• Survival Analysis
• Spatial Dependence.

Statement dc:rights

• In Copyright

Licence dc:rights.uri

• http://rightsstatements.org/vocab/InC/1.0/

Language dc:language.iso

en

Dc Identifier Other

vt_gsexam:41140

OAI identifier oai:identifier

oai:vtechworks.lib.vt.edu:10919/120579