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Virginia Polytechnic Institute

Sample and counting variations associated with x-ray flourescence [sic] analysis

Abstract

dc:description.abstract

X-ray fluorescence methods offer the chemist a much speedier analysis of multicomponent mixtures than conventional procedures. Components can be analyzed by measuring the intensity of emission lines sent out after rays strike the mixture, However, variations in the measurement of intensity do occur and are discussed in this paper. Counting error, or the inability to duplicate the exact number of radiation counts from sample to sample, is investigated and its distribution and variance are derived. Using a hierarchical model variances of batch, sample, and within sample effects are examined. These variances are compared with each other and with counting variance.

Degree

thesis:*
Name thesis:degree_name
M. S.
Level thesis:degree_level
masters
Discipline thesis:degree_discipline
Statistics
Department dc:contributor.department
Statistics
Grantor dc:publisher
Virginia Polytechnic Institute
Year dc:date.issued
1966

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Davis, Robert Loyal

Rights

dc:rights
Statement dc:rights
  • In Copyright
Language dc:language.iso
en

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/10919/114698
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/114698

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
related terms
citation

Davis, Robert Loyal. Sample and counting variations associated with x-ray flourescence [sic] analysis. masters thesis, Virginia Polytechnic Institute, 1966. http://hdl.handle.net/10919/114698