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Virginia Polytechnic Institute and State University

Characterization of thin silicone films formed by migration across defined polymer substrates

Abstract

dc:description.abstract

While theoretical treatments of liquid spreading on solid surfaces can be found in abundance in the literature, relatively few experimental studies have been performed. This study focused on the experimental detection of polydimethylsiloxane spreading on polymer surfaces in the spreading regime where gravitational and inertial forces are negligible. The techniques of x-ray photoelectron spectroscopy (XPS), reflection absorption spectroscopy (RAS), and contact angle analysis were used to investigate this problem. XPS analysis indicated that the surface spreading or "creeping" was very slow, moving only several centimeters per several hundred hours in some cases. An interesting observation was that the spreading film seemed to reach a "steady state" concentration when covering an area. Similar results were seen for both horizontal and vertical substrate surfaces with XPS, and there seemed to be a substrate dependence. Angular-dependent XPS analysis revealed that the film was very thin (<20A) and not a complete layer. Contact angle analysis was used to monitor the siloxane movement, although there was a contact angle dependence on x-ray exposure time, indicating cross-linking of the surface film. Contact angle variations were also used to show that the film characteristics may be dependent on the nature of the polymer substrate. Reflection absorption spectroscopy was used to investigate thin substrate polymer films, and it was shown that theoretical predictions of absorption band intensity correlated reasonably well with the experiment. This technique was also used to investigate the surface siloxane layer and indicated that under some conditions, the orientation of the surface silicone layer may be occurring.

Degree

thesis:*
Name thesis:degree_name
M.S.
Level thesis:degree_level
masters
Discipline thesis:degree_discipline
Chemistry
Department dc:contributor.department
Chemistry
Grantor dc:publisher
Virginia Polytechnic Institute and State University
Year dc:date.issued
1985

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Webster, H. Francis

Rights

dc:rights
Statement dc:rights
  • In Copyright
Language dc:language.iso
en

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/10919/106067
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/106067

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
related terms
citation

Webster, H. Francis. Characterization of thin silicone films formed by migration across defined polymer substrates. masters thesis, Virginia Polytechnic Institute and State University, 1985. http://hdl.handle.net/10919/106067