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Virginia Tech

Gate-level Leakage Assessment and Mitigation

Abstract

dc:description.abstract

Side-channel leakage, caused by imperfect implementation of cryptographic algorithms in hardware, has become a serious security threat for connected devices that generate and process sensitive data. This side-channel leakage can divulge secret information in the form of power consumption or electromagnetic emissions. The side-channel leakage of a crytographic device is commonly assessed after tape-out on a physical prototype. This thesis presents a methodology called Gate-level Leakage Assessment (GLA), which evaluates the power-based side-channel leakage of an integrated circuit at design time. By combining side-channel leakage assessment with power simulations on the gate-level netlist, GLA is able to pinpoint the leakiest cells in the netlist in addition to assessing the overall side-channel vulnerability to side-channel leakage. As the power traces obtained from power simulations are noiseless, GLA is able to precisely locate the sources of side-channel leakage with fewer measurements than on a physical prototype. The thesis applies the methodology on the design of a encryption co-processor to analyze sources of side-channel leakage. Once the gate-level leakage sources are identified, this thesis presents a logic level replacement strategy for the leakage sources that can thwart side-channel leakage. The countermeasures presented selectively replaces gate-level cells with a secure logic style effectively removing the side-channel leakage with minimal impact in area. The assessment methodology along with the countermeasures demonstrated is a turnkey solution for IP module designers and is also applicable to larger system level designs.

Degree

thesis:*
Name thesis:degree_name
Master of Science
Level thesis:degree_level
masters
Discipline thesis:degree_discipline
Computer Engineering
Department dc:contributor.department
Electrical and Computer Engineering
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
2019

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Kathuria, Tarun
Chair dc:contributor.committeechair
  • Schaumont, Patrick R.
Committee members dc:contributor.committeemember
  • Patterson, Cameron D.
  • Jian, Xun

Subjects

dc:subject × 3

Rights

dc:rights
Statement dc:rights
  • In Copyright

Identifiers

dc:identifier.*
Dc Identifier Other
vt_gsexam:21837
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/101862

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Kathuria, Tarun. Gate-level Leakage Assessment and Mitigation. masters thesis, Virginia Tech, 2019. http://hdl.handle.net/10919/101862